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Polarized x-ray spectroscopy of quaternary ferromagnetic semiconductor (ga,mn)(as,p) thin films

文献类型:期刊论文

作者Wadley, P.1; Casiraghi, A.1; Wang, M.1; Edmonds, K. W.1; Campion, R. P.1; Rushforth, A. W.1; Gallagher, B. L.1; Staddon, C. R.1; Wang, K. Y.2; van der Laan, G.3
刊名Applied physics letters
出版日期2011-07-11
卷号99期号:2页码:3
ISSN号0003-6951
DOI10.1063/1.3609776
通讯作者Edmonds, k. w.(kevin.edmonds@nottingham.ac.uk)
英文摘要X-ray magnetic circular dichroism (xmcd) is used to study the magnetic and electronic properties of the quaternary diluted magnetic semiconductor (ga,mn)(as,p) as a function of the p concentration y. a clear signature of the variation in strain, from compressive to tensile on increasing y, is observed in the angular dependence of the hybridized d(5)-like mn l(2,3) xmcd spectra. the ferromagnetic transition temperature and magnetic moment per mn ion both decrease steadily with increasing y. (c) 2011 american institute of physics. [doi: 10.1063/1.3609776]
WOS关键词CIRCULAR-DICHROISM ; ABSORPTION
WOS研究方向Physics
WOS类目Physics, Applied
语种英语
WOS记录号WOS:000292777300037
出版者AMER INST PHYSICS
URI标识http://www.irgrid.ac.cn/handle/1471x/2428345
专题半导体研究所
通讯作者Edmonds, K. W.
作者单位1.Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD, England
2.CAS, Inst Semicond, SKLSM, Beijing 100083, Peoples R China
3.Diamond Light Source, Didcot OX11 0DE, Oxon, England
4.Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
推荐引用方式
GB/T 7714
Wadley, P.,Casiraghi, A.,Wang, M.,et al. Polarized x-ray spectroscopy of quaternary ferromagnetic semiconductor (ga,mn)(as,p) thin films[J]. Applied physics letters,2011,99(2):3.
APA Wadley, P..,Casiraghi, A..,Wang, M..,Edmonds, K. W..,Campion, R. P..,...&Arenholz, E..(2011).Polarized x-ray spectroscopy of quaternary ferromagnetic semiconductor (ga,mn)(as,p) thin films.Applied physics letters,99(2),3.
MLA Wadley, P.,et al."Polarized x-ray spectroscopy of quaternary ferromagnetic semiconductor (ga,mn)(as,p) thin films".Applied physics letters 99.2(2011):3.

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来源:半导体研究所

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