中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Infrared response of the lateral pin structure of a highly titanium-doped silicon-on-insulator material

文献类型:期刊论文

作者Ma Zhi-Hua; Cao Quan; Zuo Yu-Hua; Zheng Jun; Xue Chun-Lai; Cheng Bu-Wen; Wang Qi-Ming
刊名Chinese physics b
出版日期2011-10-01
卷号20期号:10页码:4
关键词Infrared response Ion implantation Rapid thermal annealing Intermediate band solar cell
ISSN号1674-1056
DOI10.1088/1674-1056/20/10/106104
通讯作者Zuo yu-hua(yhzuo@semi.ac.cn)
英文摘要The intermediate band (ib) solar cell is a promising third-generation solar cell that could possibly achieve very high efficiency above the shockley-queisser limit. one of the promising ways to synthesize ib material is to introduce heavily doped deep level impurities in conventional semiconductors. high-doped ti with a concentration of 10(20) cm (3)-10(21) cm(-3) in the p-type top si layer of silicon-on-insulator (soi) substrate is obtained by ion implantation and rapid thermal annealing (rta). secondary ion mass spectrometry measurements confirm that the ti concentration exceeds the theoretical mott limit, the main requirement for the formation of an impurity intermediate band. increased absorption is observed in the infrared (ir) region by fourier transform infrared spectroscopy (ftir) technology. by using a lateral p-i-n structure, an obvious infrared response in a range of 1100 nm-2000 nm is achieved in a heavily ti-doped soi substrate, suggesting that the improvement on ir photoresponse is a result of increased absorption in the ir. the experimental results indicate that heavily ti-implanted si can be used as a potential kind of intermediate-band photovoltaic material to utilize the infrared photons of the solar spectrum.
WOS关键词PHOTODIODE
WOS研究方向Physics
WOS类目Physics, Multidisciplinary
语种英语
WOS记录号WOS:000295969000053
出版者IOP PUBLISHING LTD
URI标识http://www.irgrid.ac.cn/handle/1471x/2428403
专题半导体研究所
通讯作者Zuo Yu-Hua
作者单位Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Ma Zhi-Hua,Cao Quan,Zuo Yu-Hua,et al. Infrared response of the lateral pin structure of a highly titanium-doped silicon-on-insulator material[J]. Chinese physics b,2011,20(10):4.
APA Ma Zhi-Hua.,Cao Quan.,Zuo Yu-Hua.,Zheng Jun.,Xue Chun-Lai.,...&Wang Qi-Ming.(2011).Infrared response of the lateral pin structure of a highly titanium-doped silicon-on-insulator material.Chinese physics b,20(10),4.
MLA Ma Zhi-Hua,et al."Infrared response of the lateral pin structure of a highly titanium-doped silicon-on-insulator material".Chinese physics b 20.10(2011):4.

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来源:半导体研究所

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