中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Analysis of atomic force microscopic results of inas islands formed by molecular beam epitaxy

文献类型:期刊论文

作者Gong, Q; Liang, JB; Xu, B; Ding, D; Li, HX; Jiang, C; Zhou, W; Liu, FQ; Wang, ZG; Qiu, XH
刊名Journal of crystal growth
出版日期1998-09-01
卷号192期号:3-4页码:376-380
关键词Nanometer island Inas Molecular beam epitaxy Atomic force microscopy Quantum dot
ISSN号0022-0248
通讯作者Gong, q()
英文摘要Atomic force microscopy (afm) measurements of nanometer-sized islands formed by 2 monolayers of inas by molecular beam epitaxy have been carried out and the scan line of individual islands was extracted from raw afm data for investigation. it is found that the base widths of nanometer-sized islands obtained by afm are not reliable due to the finite size and shape of the contacting probe. a simple model is proposed to analyze the deviation of the measured value from the real value of the base width of inas islands. (c) 1998 elsevier science b.v. all rights reserved.
WOS关键词ASSEMBLED QUANTUM DOTS ; GAAS ; LASERS ; GROWTH
WOS研究方向Crystallography ; Materials Science ; Physics
WOS类目Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
语种英语
WOS记录号WOS:000075840000003
出版者ELSEVIER SCIENCE BV
URI标识http://www.irgrid.ac.cn/handle/1471x/2428553
专题半导体研究所
通讯作者Gong, Q
作者单位1.Chinese Acad Sci, Inst Semicond, Lab Semicond Mat Sci, Beijing 100083, Peoples R China
2.Chinese Acad Sci, Inst Chem, Beijing 100082, Peoples R China
推荐引用方式
GB/T 7714
Gong, Q,Liang, JB,Xu, B,et al. Analysis of atomic force microscopic results of inas islands formed by molecular beam epitaxy[J]. Journal of crystal growth,1998,192(3-4):376-380.
APA Gong, Q.,Liang, JB.,Xu, B.,Ding, D.,Li, HX.,...&Bai, CL.(1998).Analysis of atomic force microscopic results of inas islands formed by molecular beam epitaxy.Journal of crystal growth,192(3-4),376-380.
MLA Gong, Q,et al."Analysis of atomic force microscopic results of inas islands formed by molecular beam epitaxy".Journal of crystal growth 192.3-4(1998):376-380.

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来源:半导体研究所

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