中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Interference effects in differential reflectance spectra of the gaas epilayers grown on si substrate

文献类型:期刊论文

作者Zhao, MS; Dai, ZX; Li, GH; Wang, RZ; Jiang, DS
刊名Journal of applied physics
出版日期1998-12-01
卷号84期号:11页码:6466-6468
ISSN号0021-8979
通讯作者Zhao, ms(mszhao@ji-public.sd.cninfo.net)
英文摘要We report the observation of oscillating features in differential reflectance spectra from the gaas epilayer grown on si substrate in the energy range both below and above the fundamental band gap. it is demonstrated that the oscillating features are due to the difference in the interference between two neighboring areas of the sample. the interference arises from two light beams reflected from different interfaces of the sample. the calculated spectra in the nonabsorption region are in good agreement with measured data. it is shown that the interference effect can be used as a sensitive method to characterize the inhomogeneity of the semiconductor heterostructures. (c) 1998 american institute of physics. [s0021-8979(98)08723-4].
WOS关键词SEMICONDUCTORS ; SPECTROSCOPY
WOS研究方向Physics
WOS类目Physics, Applied
语种英语
WOS记录号WOS:000076930100098
出版者AMER INST PHYSICS
URI标识http://www.irgrid.ac.cn/handle/1471x/2428628
专题半导体研究所
通讯作者Zhao, MS
作者单位1.Qufu Normal Univ, Laser Res Inst, Shandong 273165, Peoples R China
2.Beijing Normal Univ, Dept Phys, Beijing 100875, Peoples R China
3.Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Zhao, MS,Dai, ZX,Li, GH,et al. Interference effects in differential reflectance spectra of the gaas epilayers grown on si substrate[J]. Journal of applied physics,1998,84(11):6466-6468.
APA Zhao, MS,Dai, ZX,Li, GH,Wang, RZ,&Jiang, DS.(1998).Interference effects in differential reflectance spectra of the gaas epilayers grown on si substrate.Journal of applied physics,84(11),6466-6468.
MLA Zhao, MS,et al."Interference effects in differential reflectance spectra of the gaas epilayers grown on si substrate".Journal of applied physics 84.11(1998):6466-6468.

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来源:半导体研究所

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