中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Numerical evaluation of energy loss rate for hot carriers in quantum wells

文献类型:期刊论文

作者Zhu, BF; Huang, K; Zhang, JZ
刊名Superlattices and microstructures
出版日期1998
卷号23期号:1页码:87-92
关键词Hot carrier relaxation Hot phonon effect Electron-phonon interaction
ISSN号0749-6036
通讯作者Zhu, bf()
英文摘要Using the frohlich potential associated with realistic optical phonon modes in quantum well systems, the energy loss rates of hot electrons, holes, and electron-hole pairs are calculated, with special emphasis on the effects of carrier density, hot phonon population, quantum well width, and phonon dispersion on the hot-carrier relaxation process in quasi-two-dimensional systems. (c) 1998 academic press limited.
WOS关键词SUPERLATTICES
WOS研究方向Physics
WOS类目Physics, Condensed Matter
语种英语
WOS记录号WOS:000072338200016
出版者ACADEMIC PRESS LTD
URI标识http://www.irgrid.ac.cn/handle/1471x/2428629
专题半导体研究所
通讯作者Zhu, BF
作者单位Chinese Acad Sci, Inst Semicond, Natl Lab Superlattices & Related Microstruct, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Zhu, BF,Huang, K,Zhang, JZ. Numerical evaluation of energy loss rate for hot carriers in quantum wells[J]. Superlattices and microstructures,1998,23(1):87-92.
APA Zhu, BF,Huang, K,&Zhang, JZ.(1998).Numerical evaluation of energy loss rate for hot carriers in quantum wells.Superlattices and microstructures,23(1),87-92.
MLA Zhu, BF,et al."Numerical evaluation of energy loss rate for hot carriers in quantum wells".Superlattices and microstructures 23.1(1998):87-92.

入库方式: iSwitch采集

来源:半导体研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。