中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The effects of carbonized buffer layer on the growth of sic on si

文献类型:期刊论文

作者Wang, YS; Li, JM; Zhang, FF; Lin, LY
刊名Journal of crystal growth
出版日期1999-05-01
卷号201页码:564-567
ISSN号0022-0248
关键词Si Sic Carbonization Rheed Single crystal epilayer
通讯作者Wang, ys()
英文摘要Carbonized buffer layers were formed with c2h4 on si(100) and si(111) substrates using different methods and sic epilayers were grown on each buffer layer at 1050 degrees c with simultaneous supply of c2h4 and si2h6. the structure of carbonized and epitaxy layers was analyzed with in situ rheed. the buffer layers formed at 800 degrees c were polycrystalline on both si(100) and si(111) substrates whereas they were single crystals, with twins on si(100) and without tu ins on si(111)substrates. when formed with a gradual rise in substrate temperature from 300 degrees c to growth temperature. raising the substrate temperature slowly results in the formation of more twins. epilayers grown on carbonized polycrystalline lavers are polycrystalline. single crystal epilayers without twins grow on single crystalline buffer layers without twins or with a few twins. (c) 1999 elsevier science b.v. all rights reserved.
WOS关键词HETEROEPITAXIAL GROWTH ; HYDROCARBON RADICALS ; SI(001) SURFACE ; BEAM
WOS研究方向Crystallography ; Materials Science ; Physics
WOS类目Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied
语种英语
出版者ELSEVIER SCIENCE BV
WOS记录号WOS:000080406000121
URI标识http://www.irgrid.ac.cn/handle/1471x/2428668
专题半导体研究所
通讯作者Wang, YS
作者单位Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Wang, YS,Li, JM,Zhang, FF,et al. The effects of carbonized buffer layer on the growth of sic on si[J]. Journal of crystal growth,1999,201:564-567.
APA Wang, YS,Li, JM,Zhang, FF,&Lin, LY.(1999).The effects of carbonized buffer layer on the growth of sic on si.Journal of crystal growth,201,564-567.
MLA Wang, YS,et al."The effects of carbonized buffer layer on the growth of sic on si".Journal of crystal growth 201(1999):564-567.

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来源:半导体研究所

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