Structural characterization of ingaas/gaas quantum dots superlattice infrared photodetector structures
文献类型：期刊论文
| 作者 | Zhuang, QD; Li, JM; Zeng, YP; Pan, L; Li, HX; Kong, MY; Lin, LY |
| 刊名 | Journal of crystal growth
 |
| 出版日期 | 1999-04-01 |
| 卷号 | 200期号:3-4页码:375-381 |
| 关键词 | Ingaas/gaas Quantum dots Superlattice Structure Tem X-ray |
| ISSN号 | 0022-0248 |
| 通讯作者 | Zhuang, qd(qdzhuang@red.semi.ac.cn) |
| 英文摘要 | Ingaas/gaas quantum dots (qds) superlattice grown by molecular beam epitaxy (mbe) at different substrate temperatures for fabricating 8-12 mu m infrared photodetector were characterized by transmission electron microscopy (tem), double-crystal x-ray diffraction (dcxrd) and photoluminescence (pl). high-quality qds superlattice can be achieved by higher growth temperature. cross-sectional tem shows the qds in the successive layers are vertically aligned along growth direction. interaction of partial vertically aligned columns leads to a perfect vertical ordering. with increasing number of bilayers, the average qds size becomes larger in height and rapidly saturates at a certain value, while average lateral length nearly preserves initial size. this change leads to the formation of qds homogeneous in size and of a particular shape. the observed self-organizations are attributed to the effect of strain distribution at qds on the kinetic growth process. dcxrd measurement shows two sets of satellite peaks which corresponds to qds superlattice and multi quantum wells formed by the wetting layers. kinematical simulations of the wetting layers indicate that the formation of qds is associated with a decrease of the effective indium content in the wetting layers. (c) 1999 elsevier science b.v. all rights reserved. |
| WOS关键词 | X-RAY-DIFFRACTION ; ISLANDS ; GROWTH ; GAAS ; MULTILAYERS ; SURFACES |
| WOS研究方向 | Crystallography ; Materials Science ; Physics |
| WOS类目 | Crystallography ; Materials Science, Multidisciplinary ; Physics, Applied |
| 语种 | 英语 |
| WOS记录号 | WOS:000079859800006 |
| 出版者 | ELSEVIER SCIENCE BV |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2428761 |
| 专题 | 半导体研究所 |
| 通讯作者 | Zhuang, QD |
| 作者单位 | Chinese Acad Sci, Inst Semicond, Novel Mat Ctr, Beijing 100083, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhuang, QD,Li, JM,Zeng, YP,et al. Structural characterization of ingaas/gaas quantum dots superlattice infrared photodetector structures[J]. Journal of crystal growth,1999,200(3-4):375-381. |
| APA | Zhuang, QD.,Li, JM.,Zeng, YP.,Pan, L.,Li, HX.,...&Lin, LY.(1999).Structural characterization of ingaas/gaas quantum dots superlattice infrared photodetector structures.Journal of crystal growth,200(3-4),375-381. |
| MLA | Zhuang, QD,et al."Structural characterization of ingaas/gaas quantum dots superlattice infrared photodetector structures".Journal of crystal growth 200.3-4(1999):375-381. |
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来源：半导体研究所
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