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Point defects in iii-v compound semiconductors

文献类型:期刊论文

作者Chen, N
刊名Defects and diffusion in semiconductors
出版日期2000
卷号183-1页码:85-93
关键词Compound semiconductors Point defects Deep level centres Stoichiometry
ISSN号1012-0386
通讯作者Chen, n()
英文摘要Point defects in iii-v compound semiconductors were analyzed systematically in this paper. the effects of substitutes, antisites, interstitials, and vacancies on lattice parameters in iii-v compound semiconductors were calculated with a simple model. the formation energies of vacancies in compound semiconductors can be obtained by this calculation. a practical technique established on this model has been utilized for measuring the stoichiometry in gaas. the relationship between stoichiometry and deep level centers in gaas was also investigated.
WOS关键词MOLECULAR-BEAM EPITAXY ; GAAS SINGLE-CRYSTALS ; SEMIINSULATING GALLIUM-ARSENIDE ; SEMI-INSULATING GAAS ; ELECTRICAL-PROPERTIES ; LATTICE-PARAMETER ; NATIVE DEFECTS ; CARBON ; DIFFRACTOMETER ; STOICHIOMETRY
WOS研究方向Materials Science ; Physics
WOS类目Materials Science, Multidisciplinary ; Physics, Condensed Matter
语种英语
WOS记录号WOS:000089882500007
出版者SCITEC PUBLICATIONS LTD
URI标识http://www.irgrid.ac.cn/handle/1471x/2428865
专题半导体研究所
通讯作者Chen, N
作者单位Chinese Acad Sci, Inst Semicond, Lab Semicond Mat Sci, Beijing 100864, Peoples R China
推荐引用方式
GB/T 7714
Chen, N. Point defects in iii-v compound semiconductors[J]. Defects and diffusion in semiconductors,2000,183-1:85-93.
APA Chen, N.(2000).Point defects in iii-v compound semiconductors.Defects and diffusion in semiconductors,183-1,85-93.
MLA Chen, N."Point defects in iii-v compound semiconductors".Defects and diffusion in semiconductors 183-1(2000):85-93.

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来源:半导体研究所

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