Multiplicity factor and diffraction geometry factor for single crystal x-ray diffraction analysis and measurement of phase content in cubic gan/gaas(001) epilayers
文献类型：期刊论文
| 作者 | Qu, B; Zheng, XH; Wang, YT; Feng, ZH; Han, JY; Liu, S; Lin, SM; Yang, H; Liang, JW |
| 刊名 | Science in china series a-mathematics physics astronomy
 |
| 出版日期 | 2001-04-01 |
| 卷号 | 44期号:4页码:497-503 |
| 关键词 | Four-circle diffraction Gan Phase content |
| ISSN号 | 1006-9283 |
| 通讯作者 | Qu, b() |
| 英文摘要 | On the basis of integrated intensity of rocking curves, the multiplicity factor and the diffraction geometry factor for single crystal x-ray diffraction (xrd) analysis were proposed and a general formula for calculating the content of mixed phases was obtained. with a multifunction four-circle x-ray double-crystal diffractometer, pole figures of cubic (002), {111} and hexagonal {1010} and reciprocal space mapping were measured to investigate the distributive character of mixed phases and to obtain their multiplicity factors and diffraction geometry factors. the contents of cubic twins and hexagonal inclusions were calculated by the integrated intensities of rocking curves of cubic (002), cubic twin {111}, hexagonal {1010} and {1011}. |
| WOS关键词 | MOLECULAR-BEAM EPITAXY ; GAN FILMS ; GROWTH ; STABILITY ; RATIO |
| WOS研究方向 | Mathematics |
| WOS类目 | Mathematics, Applied ; Mathematics |
| 语种 | 英语 |
| WOS记录号 | WOS:000168510300011 |
| 出版者 | SCIENCE PRESS |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2428968 |
| 专题 | 半导体研究所 |
| 通讯作者 | Qu, B |
| 作者单位 | 1.Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China 2.Chinese Acad Geol Sci, Inst Mineral Deposits, Beijing 100083, Peoples R China |
| 推荐引用方式 GB/T 7714 | Qu, B,Zheng, XH,Wang, YT,et al. Multiplicity factor and diffraction geometry factor for single crystal x-ray diffraction analysis and measurement of phase content in cubic gan/gaas(001) epilayers[J]. Science in china series a-mathematics physics astronomy,2001,44(4):497-503. |
| APA | Qu, B.,Zheng, XH.,Wang, YT.,Feng, ZH.,Han, JY.,...&Liang, JW.(2001).Multiplicity factor and diffraction geometry factor for single crystal x-ray diffraction analysis and measurement of phase content in cubic gan/gaas(001) epilayers.Science in china series a-mathematics physics astronomy,44(4),497-503. |
| MLA | Qu, B,et al."Multiplicity factor and diffraction geometry factor for single crystal x-ray diffraction analysis and measurement of phase content in cubic gan/gaas(001) epilayers".Science in china series a-mathematics physics astronomy 44.4(2001):497-503. |
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来源：半导体研究所
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