Two-port calibration of test fixtures with different test ports
文献类型：期刊论文
| 作者 | Zhen, YC; You, LW; Yu, L; Ning, HZ |
| 刊名 | Microwave and optical technology letters
 |
| 出版日期 | 2002-11-20 |
| 卷号 | 35期号:4页码:299-302 |
| 关键词 | Two-port calibration Microwave network analyzer Scattering-parameter measurement Phase uncertainty |
| ISSN号 | 0895-2477 |
| 通讯作者 | Zhen, yc() |
| 英文摘要 | The open-short-load (osl) method is very simple and widely used for one-port test fixture calibration. in this paper, this method is extended, for the first time, to the two-port calibration of test fixtures with different test ports. the problem of phase uncertainty arising in this application has been solved. the comparison between our results and those obtained with the solt method shows that the method established is accurate for practical applications. (c) 2002 wiley periodicals, inc. |
| WOS关键词 | NETWORK-ANALYZER CALIBRATION ; LINE |
| WOS研究方向 | Engineering ; Optics |
| WOS类目 | Engineering, Electrical & Electronic ; Optics |
| 语种 | 英语 |
| WOS记录号 | WOS:000178998700014 |
| 出版者 | JOHN WILEY & SONS INC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2429167 |
| 专题 | 半导体研究所 |
| 通讯作者 | Zhen, YC |
| 作者单位 | Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhen, YC,You, LW,Yu, L,et al. Two-port calibration of test fixtures with different test ports[J]. Microwave and optical technology letters,2002,35(4):299-302. |
| APA | Zhen, YC,You, LW,Yu, L,&Ning, HZ.(2002).Two-port calibration of test fixtures with different test ports.Microwave and optical technology letters,35(4),299-302. |
| MLA | Zhen, YC,et al."Two-port calibration of test fixtures with different test ports".Microwave and optical technology letters 35.4(2002):299-302. |
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来源：半导体研究所
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