New algorithms of the tsm and tom methods for calibrating microwave test fixtures
文献类型：期刊论文
| 作者 | Zhu, NH; Chen, ZY; Wang, YL |
| 刊名 | Microwave and optical technology letters
 |
| 出版日期 | 2002-07-05 |
| 卷号 | 34期号:1页码:26-31 |
| 关键词 | Microwave network analyzer Test fixtures Calibration Scattering-parameter measurement |
| ISSN号 | 0895-2477 |
| DOI | 10.1002/mop.10363 |
| 通讯作者 | Zhu, nh() |
| 英文摘要 | Based on the conventional through-short-match (tsm) method, an improved tsm method has been proposed in this letter. this method gives an analytical solution and has almost all the advantages of conventional tsm methods. for example, it has no phase uncertainty and no bandwidth limitation. the experimental results show that the accuracy can be significantly improved with this method. the proposed theory can be applied to the through-open-match (tom) method. (c) 2002 wiley periodicals. inc. |
| WOS关键词 | NETWORK-ANALYZER CALIBRATION |
| WOS研究方向 | Engineering ; Optics |
| WOS类目 | Engineering, Electrical & Electronic ; Optics |
| 语种 | 英语 |
| WOS记录号 | WOS:000175934100010 |
| 出版者 | JOHN WILEY & SONS INC |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2429182 |
| 专题 | 半导体研究所 |
| 通讯作者 | Zhu, NH |
| 作者单位 | Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhu, NH,Chen, ZY,Wang, YL. New algorithms of the tsm and tom methods for calibrating microwave test fixtures[J]. Microwave and optical technology letters,2002,34(1):26-31. |
| APA | Zhu, NH,Chen, ZY,&Wang, YL.(2002).New algorithms of the tsm and tom methods for calibrating microwave test fixtures.Microwave and optical technology letters,34(1),26-31. |
| MLA | Zhu, NH,et al."New algorithms of the tsm and tom methods for calibrating microwave test fixtures".Microwave and optical technology letters 34.1(2002):26-31. |
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来源：半导体研究所
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