中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Crystallographic tilt in gan layers grown by epitaxial lateral overgrowth

文献类型:期刊论文

作者Feng, G; Zheng, XH; Zhu, JJ; Shen, XM; Zhang, BS; Zhao, DG; Sun, YP; Zhang, ZH; Wang, YT; Yang, H
刊名Science in china series a-mathematics physics astronomy
出版日期2002-11-01
卷号45期号:11页码:1461-1467
ISSN号1006-9283
关键词Gan Epitaxial lateral overgrowth Crystallographic tilt Double crystal x-ray diffraction
通讯作者Feng, g()
英文摘要The crystallographic tilt in gan layers grown by epitaxial lateral overgrowth (elo) on sapphire (0001) substrates was investigated by using double crystal x-ray diffraction (dc-xrd). it was found that elo gan stripes bent towards the sinx mask in the direction perpendicular to seeding lines. each side of gan (0002) peak in dc-xrd rocking curves was a broad peak related with the crystallographic tilt. this broad peak split into two peaks (denoted as a and b), and peak b disappeared gradually when the mask began to be removed by selective etching. only narrow peak a remained when the sinx mask was removed completely. a model based on these results has been developed to show that there are two factors responsible for the crystallographic tilt: one is the non-uniformity elastic deformation caused by the interphase force between the elo gan layer and the sinx mask. the other is the plastic deformation, which is attributed to the change of the threading dislocations (tds)-from vertical in the window regions to the lateral in the regions over the mask.
WOS关键词FILMS ; DEFECTS ; GAAS
WOS研究方向Mathematics
WOS类目Mathematics, Applied ; Mathematics
语种英语
出版者SCIENCE CHINA PRESS
WOS记录号WOS:000179209500012
URI标识http://www.irgrid.ac.cn/handle/1471x/2429191
专题半导体研究所
通讯作者Feng, G
作者单位Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Feng, G,Zheng, XH,Zhu, JJ,et al. Crystallographic tilt in gan layers grown by epitaxial lateral overgrowth[J]. Science in china series a-mathematics physics astronomy,2002,45(11):1461-1467.
APA Feng, G.,Zheng, XH.,Zhu, JJ.,Shen, XM.,Zhang, BS.,...&Liang, JW.(2002).Crystallographic tilt in gan layers grown by epitaxial lateral overgrowth.Science in china series a-mathematics physics astronomy,45(11),1461-1467.
MLA Feng, G,et al."Crystallographic tilt in gan layers grown by epitaxial lateral overgrowth".Science in china series a-mathematics physics astronomy 45.11(2002):1461-1467.

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来源:半导体研究所

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