Content analyses in gamnas by double-crystal x-ray diffraction
文献类型：期刊论文
| 作者 | Chen, NF; Xiu, HX; Yang, JL; Wu, JL; Zhong, XR; Lin, LY |
| 刊名 | Chinese science bulletin
 |
| 出版日期 | 2002-02-01 |
| 卷号 | 47期号:4页码:274-275 |
| 关键词 | Gamnas Diluted magnetic semiconductor X-ray diffraction Lattice parameter Content of mn |
| ISSN号 | 1001-6538 |
| 通讯作者 | Chen, nf() |
| 英文摘要 | A model for analyzing point defects in compound crystals was improved. based on this modified model, a method for measuring mn content in gamnas was established. a technique for eliminating the zero-drift-error was also established in the experiments of x-ray diffraction. with these methods, the mn content in gamnas single crystals fabricated by the ion-beam epitaxy system was analyzed. |
| WOS关键词 | SEMICONDUCTOR |
| WOS研究方向 | Science & Technology - Other Topics |
| WOS类目 | Multidisciplinary Sciences |
| 语种 | 英语 |
| WOS记录号 | WOS:000175218100003 |
| 出版者 | SCIENCE CHINA PRESS |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2429198 |
| 专题 | 半导体研究所 |
| 通讯作者 | Chen, NF |
| 作者单位 | 1.Chinese Acad Sci, Inst Semicond, Lab Semicond Mat Sci, Beijing 100083, Peoples R China 2.Chinese Acad Sci, Natl Micrograv Lab, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Chen, NF,Xiu, HX,Yang, JL,et al. Content analyses in gamnas by double-crystal x-ray diffraction[J]. Chinese science bulletin,2002,47(4):274-275. |
| APA | Chen, NF,Xiu, HX,Yang, JL,Wu, JL,Zhong, XR,&Lin, LY.(2002).Content analyses in gamnas by double-crystal x-ray diffraction.Chinese science bulletin,47(4),274-275. |
| MLA | Chen, NF,et al."Content analyses in gamnas by double-crystal x-ray diffraction".Chinese science bulletin 47.4(2002):274-275. |
入库方式： iSwitch采集
来源：半导体研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。