Abatement of waste gases and water during the processes of semiconductor fabrication
文献类型：期刊论文
| 作者 | Wen, RM; Liang, JW |
| 刊名 | Journal of environmental sciences-china
 |
| 出版日期 | 2002-10-01 |
| 卷号 | 14期号:4页码:482-488 |
| 关键词 | Waste gases Waste water Abatement Pollutant Semiconductor |
| ISSN号 | 1001-0742 |
| 通讯作者 | Liang, jw() |
| 英文摘要 | The purpose of this article is to examine the methods and equipment for abating waste gases and water produced during the manufacture of semiconductor materials and devices. three separating methods and equipment are used to control three different groups of electronic wastes. the first group includes arsine and phosphine emitted during the processes of semiconductor materials manufacture. the abatement procedure for this group of pollutants consists of adding iodates, cupric and manganese salts to a multiple shower tower (mst) structure. the second group includes pollutants containing arsenic, phosphorus, hf, hcl, no2, and so3 emitted during the manufacture of semiconductor materials and devices. the abatement procedure involves mixing oxidants and bases in an oval column with a separator in the middle. the third group consists of the ions of as, p and heavy metals contained in the waste water. the abatement procedure includes adding caco3 and ferric salts in a flocculation-sedimentation compact device equipment. test results showed that all waste gases and water after the abatement procedures presented in this article passed the discharge standards set by the state environmental protection administration of china. |
| WOS关键词 | TRACE |
| WOS研究方向 | Environmental Sciences & Ecology |
| WOS类目 | Environmental Sciences |
| 语种 | 英语 |
| WOS记录号 | WOS:000178712000008 |
| 出版者 | SCIENCE CHINA PRESS |
| URI标识 | http://www.irgrid.ac.cn/handle/1471x/2429210 |
| 专题 | 半导体研究所 |
| 通讯作者 | Liang, JW |
| 作者单位 | 1.Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China 2.Tongji Univ, Shanghai 200092, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wen, RM,Liang, JW. Abatement of waste gases and water during the processes of semiconductor fabrication[J]. Journal of environmental sciences-china,2002,14(4):482-488. |
| APA | Wen, RM,&Liang, JW.(2002).Abatement of waste gases and water during the processes of semiconductor fabrication.Journal of environmental sciences-china,14(4),482-488. |
| MLA | Wen, RM,et al."Abatement of waste gases and water during the processes of semiconductor fabrication".Journal of environmental sciences-china 14.4(2002):482-488. |
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来源：半导体研究所
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