Scattering-parameter measurements of laser diodes
文献类型:期刊论文
作者 | Zhu, NH; Liu, Y; Pun, EYB; Chung, PS |
刊名 | Optical and quantum electronics
![]() |
出版日期 | 2002-08-01 |
卷号 | 34期号:8页码:747-757 |
关键词 | Microwave network analyzer Scattering-parameter measurement Semiconductor laser diode Test fixture calibration |
ISSN号 | 0306-8919 |
通讯作者 | Zhu, nh() |
英文摘要 | An accurate and simple technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips is proposed and demonstrated. all the packaging parasitics could be obtained accurately using a calibrated probe, and the impedance of the intrinsic diode chip is deduced from the directly measured reflection coefficient. the directly measured impedance of a laser diode is affected strongly by the short bond wire. in the frequency response (s(2)1) measurements of semiconductor laser diode chips, the test fixture consists of a microwave probe, a submount, and a bond wire. the s-parameters of the probe could be determined using the short-open-match (som) method. both the attenuation and the reflection of the test fixture have a strong influence on the directly measured frequency response, and in our proposed technique, the effect of test fixture is completely removed. |
WOS关键词 | TEST FIXTURES ; CALIBRATION |
WOS研究方向 | Engineering ; Optics |
WOS类目 | Engineering, Electrical & Electronic ; Optics |
语种 | 英语 |
WOS记录号 | WOS:000177142200003 |
出版者 | KLUWER ACADEMIC PUBL |
URI标识 | http://www.irgrid.ac.cn/handle/1471x/2429216 |
专题 | 半导体研究所 |
通讯作者 | Zhu, NH |
作者单位 | 1.Chinese Acad Sci, Inst Semicond, Natl Res Ctr Optoelect Technol, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China 2.City Univ Hong Kong, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China |
推荐引用方式 GB/T 7714 | Zhu, NH,Liu, Y,Pun, EYB,et al. Scattering-parameter measurements of laser diodes[J]. Optical and quantum electronics,2002,34(8):747-757. |
APA | Zhu, NH,Liu, Y,Pun, EYB,&Chung, PS.(2002).Scattering-parameter measurements of laser diodes.Optical and quantum electronics,34(8),747-757. |
MLA | Zhu, NH,et al."Scattering-parameter measurements of laser diodes".Optical and quantum electronics 34.8(2002):747-757. |
入库方式: iSwitch采集
来源:半导体研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。