中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Design of UV LED illumination system for direct imaging lithography

文献类型:会议论文

作者Jiang, Haibo; Sun, Xiuhui; Yang, Ruofu; Chen, Jianjun; Xie, Lin; Yin, Shao-Yun
出版日期2018
会议日期October 11, 2018 - October 13, 2018
会议地点Beijing, China
DOI10.1117/12.2500955
英文摘要UV LED, which is used as the illumination source in the direct imaging (DI) exposure equipment, has the advantages of rich wavelengths and low cost. It has a good application prospect in the field of printed circuit board (PCB) manufacturing. An optical structure of the illumination system for DI lithography, which combines Kohler illumination and double telecentric imaging, is presented. First, the shape of the spot matched with Digital Micromirror Device (DMD) is obtained by setting an aperture at the imaging plane of LED chips to filter out the stray light. Then the aperture is imaged onto the working plane of DMD by the posterior double telecentric lens. The uniform illumination spot without stray light can be achieved on the DMD in the end. In this design, fly eyes are not needed, and the stray light on the DMD surface caused by light outside the effective angle of the LED can be filtered out completely. Based on this idea, a lithographic illumination system with the numerical aperture (NA) of 0.1 is designed and fabricated for 0.95 inch DMD. According to experimental measurements, the effective illumination power is up to 10W, and the illuminance uniformity is more than 85%, which meet the lighting requirements of direct imaging lithography equipment used in PCB manufacturing. © 2018 SPIE.
会议录Optical Design and Testing VIII 2018
语种英语
电子版国际标准刊号1996756X
ISSN号0277786X
源URL[http://119.78.100.138/handle/2HOD01W0/7964]  
专题集成光电技术研究中心
作者单位Optoelectronic Technology Integration Research Center, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing; 400714, China
推荐引用方式
GB/T 7714
Jiang, Haibo,Sun, Xiuhui,Yang, Ruofu,et al. Design of UV LED illumination system for direct imaging lithography[C]. 见:. Beijing, China. October 11, 2018 - October 13, 2018.

入库方式: OAI收割

来源:重庆绿色智能技术研究院

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。