Signal detection techniques for scattering-type scanning near-field optical microscopy
文献类型：期刊论文
| 作者 | Dai, Guangbin1,2; Yang, Zhongbo2 ; Geng, Guoshuai1,2; Li, Mingliang1; Chang, Tianying1,2; Wei, Dongshan2; Du, Chunlei2; Cui, Hong-Liang1,2; Wang, Huabin2,3
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| 刊名 | Applied Spectroscopy Reviews
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| 出版日期 | 2018 |
| 卷号 | 53期号:10页码:806-835 |
| ISSN号 | 05704928 |
| DOI | 10.1080/05704928.2018.1443275 |
| 英文摘要 | Scattering-type scanning near-field optical microscopy (s-SNOM) has been playing more and more important roles in investigating electromagnetic properties of various materials and structures on the nanoscale. In this technique, a sharp tip is employed as the near-field antenna to measure the sample's properties with a high spatial resolution. As the scattered near-field signal from the tip is extremely weak and contaminated by strong background noise, the effective detection, and subsequent extraction of the near-field information from the detected signals is the key issue for s-SNOM. In this review, we give a systematic explanation of the underlying mechanisms of s-SNOM, and summarize and interpret major signal detection techniques involved, including experimental setups, theories for signal analysis and processing, and exposition of advantages and disadvantages of such techniques. By this, we hope to provide a practical guide and a go-to source of detailed information for those interested in and/or working on s-SNOM. © 2018, © 2018 Taylor & Francis Group, LLC. |
| 电子版国际标准刊号 | 1520569X |
| 语种 | 英语 |
| 源URL | [http://119.78.100.138/handle/2HOD01W0/8024]  |
| 专题 | 太赫兹技术研究中心 |
| 作者单位 | 1.College of Instrumentation and Electrical Engineering, Jilin University, Changchun; Jilin, China; 2.Chongqing Engineering Research Center of High-Resolution and Three-Dimensional Dynamic Imaging Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing, China; 3.Key Laboratory of Interfacial Physics and Technology, Chinese Academy of Sciences, Shanghai, China |
| 推荐引用方式 GB/T 7714 | Dai, Guangbin,Yang, Zhongbo,Geng, Guoshuai,et al. Signal detection techniques for scattering-type scanning near-field optical microscopy[J]. Applied Spectroscopy Reviews,2018,53(10):806-835. |
| APA | Dai, Guangbin.,Yang, Zhongbo.,Geng, Guoshuai.,Li, Mingliang.,Chang, Tianying.,...&Wang, Huabin.(2018).Signal detection techniques for scattering-type scanning near-field optical microscopy.Applied Spectroscopy Reviews,53(10),806-835. |
| MLA | Dai, Guangbin,et al."Signal detection techniques for scattering-type scanning near-field optical microscopy".Applied Spectroscopy Reviews 53.10(2018):806-835. |
入库方式： OAI收割
来源：重庆绿色智能技术研究院
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