Direct Observation of the Dipole-Induced Energetic Disorder in Rubrene Single-Crystal Transistors by Scanning Kelvin Probe Microscopy
文献类型：期刊论文
| 作者 | Hu, Yuanyuan1; Jiang, Lang2; Chen, Qinjun1; Guo, Jing1; Chen, Zhuojun1 |
| 刊名 | JOURNAL OF PHYSICAL CHEMISTRY LETTERS
 |
| 出版日期 | 2018-06-07 |
| 卷号 | 9期号:11页码:2869-2873 |
| ISSN号 | 1948-7185 |
| DOI | 10.1021/acs.jpclett.8b01274 |
| 英文摘要 | It is commonly accepted that gate dielectric dipoles can induce energetic disorder in organic field-effect transistors. However, convincing experimental evidence that directly demonstrate this effect are still in lack. In this work, we present a combined experimental and theoretical study to reveal this effect. We have investigated the temperature-dependent mobility of two rubrene single crystal transistors with different polymer dielectrics. Model fittings of the data indicate there is higher energetic disorder in the device on dielectric with larger permittivity. Scanning Kelvin probe microscopy was then employed to directly characterize the density of tail states, which is correlated with energetic disorder, in the devices. The results further confirm that dielectric dipoles can increase energetic disorder in organic semiconductors. |
| 语种 | 英语 |
| WOS记录号 | WOS:000435026100025 |
| 出版者 | AMER CHEMICAL SOC |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/42591]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Hu, Yuanyuan |
| 作者单位 | 1.Hunan Univ, Sch Phys & Elect, Minist Educ, Key Lab Micronano Optoelect Devices, Changsha 410082, Hunan, Peoples R China 2.Chinese Acad Sci, Beijing Natl Lab Mol Sci, Inst Chem, Key Lab Organ Solids, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Hu, Yuanyuan,Jiang, Lang,Chen, Qinjun,et al. Direct Observation of the Dipole-Induced Energetic Disorder in Rubrene Single-Crystal Transistors by Scanning Kelvin Probe Microscopy[J]. JOURNAL OF PHYSICAL CHEMISTRY LETTERS,2018,9(11):2869-2873. |
| APA | Hu, Yuanyuan,Jiang, Lang,Chen, Qinjun,Guo, Jing,&Chen, Zhuojun.(2018).Direct Observation of the Dipole-Induced Energetic Disorder in Rubrene Single-Crystal Transistors by Scanning Kelvin Probe Microscopy.JOURNAL OF PHYSICAL CHEMISTRY LETTERS,9(11),2869-2873. |
| MLA | Hu, Yuanyuan,et al."Direct Observation of the Dipole-Induced Energetic Disorder in Rubrene Single-Crystal Transistors by Scanning Kelvin Probe Microscopy".JOURNAL OF PHYSICAL CHEMISTRY LETTERS 9.11(2018):2869-2873. |
入库方式： OAI收割
来源：化学研究所
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