Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling
文献类型：期刊论文
| 作者 | Pacholski, Michaeleen L.1; Qu, Zhaohui2; Ouyang, Wuye2; Zheng, Zhibo3; Wang, Rong3 |
| 刊名 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
 |
| 出版日期 | 2018-05-01 |
| 卷号 | 36期号:3 |
| ISSN号 | 1071-1023 |
| DOI | 10.1116/1.5024044 |
| 英文摘要 | Depth profiles of thin, latex films using gas cluster ion beam (GCIB) secondary ion mass spectrometry (SIMS) show an oscillation of surfactants and polymer signal that is related to the organization of the particles in the film as layers. These results demonstrate the application of GCIB-SIMS to the distribution of water soluble species with molecular sensitivity, which has implications to film performance in areas of adhesion, appearance, and cohesion. Specifically, surfactant species were found at the highest concentrations at the air interface, decreasing through the top few particle layers to a steady state, whereas salt-rich species (sulfates, oligomers) were found at every particle boundary with a high concentration at the substrate interface. Published by the AVS. |
| 语种 | 英语 |
| WOS记录号 | WOS:000432972200005 |
| 出版者 | A V S AMER INST PHYSICS |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/42867]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Pacholski, Michaeleen L. |
| 作者单位 | 1.Dow Chem Co USA, 400 Arcola Rd, Collegeville, PA 19426 USA 2.Rohm & Haas China Holding Co Ltd, 936 Zhangheng Rd,Zhangjiang Hitech Pk, Shanghai 201203, Peoples R China 3.Peking Univ, Beijing Natl Lab Mol Sci, Coll Chem & Mol Engn, Key Lab Polymer Chem & Phys,Minist Educ, Beijing 100871, Peoples R China |
| 推荐引用方式 GB/T 7714 | Pacholski, Michaeleen L.,Qu, Zhaohui,Ouyang, Wuye,et al. Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,2018,36(3). |
| APA | Pacholski, Michaeleen L.,Qu, Zhaohui,Ouyang, Wuye,Zheng, Zhibo,&Wang, Rong.(2018).Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,36(3). |
| MLA | Pacholski, Michaeleen L.,et al."Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling".JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 36.3(2018). |
入库方式： OAI收割
来源：化学研究所
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