Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope
文献类型：期刊论文
| 作者 | Yu JianQiang; Yuan JingHe; Zhang XueJie; Liu JianLi; Fang XiaoHong |
| 刊名 | CHINESE SCIENCE BULLETIN
 |
| 出版日期 | 2013-11-01 |
| 卷号 | 58期号:33页码:4045-4050 |
| 关键词 | Stimulated Emission Depletion (Sted) Microscope Atomic Force Microscope (Afm) Confocal Microscope Integrated Imaging Super-resolution Imaging |
| ISSN号 | 1001-6538 |
| DOI | 10.1007/s11434-013-6011-z |
| 英文摘要 | We have built an integrated imaging system by combining stimulated emission depletion (STED) microscope and atomic force microscope (AFM). The STED microscope was constructed based on the supercontinuum fiber laser and a super lateral resolution of 42 nm was achieved. With this integrated imaging system, morphological features, mechanical parameters and fluorescence super resolution imaging were obtained simultaneously for both nanobeads and fixed cell samples. This new integrated imaging system is expected to obtain comprehensive information at the nanoscale for studies in nanobiology and nanomedicine. |
| 语种 | 英语 |
| WOS记录号 | WOS:000326829500004 |
| 出版者 | SCIENCE PRESS |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/54527]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Fang XiaoHong |
| 作者单位 | Chinese Acad Sci, Inst Chem, Key Lab Mol Nanostruct & Nanotechnol, Beijing Natl Lab Mol Sci, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yu JianQiang,Yuan JingHe,Zhang XueJie,et al. Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope[J]. CHINESE SCIENCE BULLETIN,2013,58(33):4045-4050. |
| APA | Yu JianQiang,Yuan JingHe,Zhang XueJie,Liu JianLi,&Fang XiaoHong.(2013).Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope.CHINESE SCIENCE BULLETIN,58(33),4045-4050. |
| MLA | Yu JianQiang,et al."Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope".CHINESE SCIENCE BULLETIN 58.33(2013):4045-4050. |
入库方式： OAI收割
来源：化学研究所
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