Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films
文献类型：期刊论文
| 作者 | Lin, Y; Xiao, XR; Li, XP; Zhou, XW |
| 刊名 | SURFACE SCIENCE
 |
| 出版日期 | 2005-03-20 |
| 卷号 | 579期号:1页码:37-46 |
| 关键词 | Atomic Force Microscopy Titanium Oxide Semiconducting Surfaces Surface Chemical Reaction Fractal Surface Surface Structure Morphology Toughness And Topography |
| ISSN号 | 0039-6028 |
| DOI | 10.1016/j.susc.2005.01.033 |
| 英文摘要 | Surface morphologies of nanocrystalline TiO2 thin films were studied by analyzing the surface profile of AFM images using wavelet transform method. Based on characterizing the fractal feature and computing the image details at different orientations and resolutions, the surface textures of nanocrystalline TiO2 thin films before and after chemical treatment were examined. The results reveal that titanium isopropoxide treatment leads to an increase of surface roughness. The related mechanism of modification of the microstructure by chemical treatment associated with the improvement of the photocurrent response is discussed. (c) 2005 Elsevier B.V. All rights reserved. |
| 语种 | 英语 |
| WOS记录号 | WOS:000227850300005 |
| 出版者 | ELSEVIER SCIENCE BV |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/56369]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Xiao, XR |
| 作者单位 | Chinese Acad Sci, Inst Chem, Ctr Mol Sci, Key Lab Photochem, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Lin, Y,Xiao, XR,Li, XP,et al. Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films[J]. SURFACE SCIENCE,2005,579(1):37-46. |
| APA | Lin, Y,Xiao, XR,Li, XP,&Zhou, XW.(2005).Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films.SURFACE SCIENCE,579(1),37-46. |
| MLA | Lin, Y,et al."Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films".SURFACE SCIENCE 579.1(2005):37-46. |
入库方式： OAI收割
来源：化学研究所
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