中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The XPS investigation on the PC films irradiated by MeV C-n(+) (n = 1-5) cluster ions

文献类型:期刊论文

作者Dai, JF; Zhao, ZQ; Zhai, J; Jiang, L
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
出版日期2006
卷号243期号:1页码:38-42
关键词Cluster Ions X-ray Photoelectron Spectroscope Polycarbonate
ISSN号0168-583X
DOI10.1016/j.nimb.2005.06.233
英文摘要Irradiation of MeV C-n(+) (n = 1-5) cluster ions onto polycarbonate (PC) films was performed and the surface chemical structure was analyzed in detail by X-ray photoelectron spectroscopy (XPS). The irradiation condition was 0.6 MeV/atom and atomic dose of 5 x 10(12) ions/cm(2). The results show that the ratio of C 1s to O 1s (C/O) of PC surface irradiated by C cluster with the same atomic energy and dose gradually decreased with increasing of cluster size then tended to a saturation. It indicates that the oxygen and carbon atoms contained in PC films were selectively sputtered by carbon cluster ions. As to the ratio of C/O of PC films irradiated by individual C decreased linearly with increasing of projectile energy. XPS results show that ion beams induce the change of chemical element ratio, restructure of near surface of PC and formation of new type of bond. (c) 2005 Elsevier B.V. All rights reserved.
语种英语
WOS记录号WOS:000234658800007
出版者ELSEVIER SCIENCE BV
源URL[http://ir.iccas.ac.cn/handle/121111/60027]  
专题中国科学院化学研究所
通讯作者Zhao, ZQ
作者单位1.Peking Univ, Inst Heavy Ion Phys, Beijing 100871, Peoples R China
2.Minist Educ, Key Lab Heavy Ion Phys, Beijing 100871, Peoples R China
3.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
推荐引用方式
GB/T 7714
Dai, JF,Zhao, ZQ,Zhai, J,et al. The XPS investigation on the PC films irradiated by MeV C-n(+) (n = 1-5) cluster ions[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2006,243(1):38-42.
APA Dai, JF,Zhao, ZQ,Zhai, J,&Jiang, L.(2006).The XPS investigation on the PC films irradiated by MeV C-n(+) (n = 1-5) cluster ions.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,243(1),38-42.
MLA Dai, JF,et al."The XPS investigation on the PC films irradiated by MeV C-n(+) (n = 1-5) cluster ions".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 243.1(2006):38-42.

入库方式: OAI收割

来源:化学研究所

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