中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Blind deconvolution of x-ray diffraction profiles by using high-order statistics

文献类型:期刊论文

作者Yuan, Jinghe1,2
刊名OPTICAL ENGINEERING
出版日期2009-07-01
卷号48期号:7
关键词X-ray Diffraction Blind Deconvolution High-order Statistics
ISSN号0091-3286
DOI10.1117/1.3159868
英文摘要A high-order statistical-based, blind deconvolution algorithm is proposed for x-ray powder diffraction profiles. Maximizing the kurtosis amplitude of the deconvolved data ensures that only the data with maximized kurtosis amplitude is extracted. The ill-posed nature of deconvolution is, thus, bypassed. Using simulation and experiments, this method is seen to be very robust with respect to noise. The profile resolution is enhanced considerably, and the deconvolved profile fits the pseudo-Voigt profile nicely. However, noise is enhanced in the deconvolved data, so the algorithm may be invalid for experimental data with low signal-to-noise. (C) 2009 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.3159868]
语种英语
WOS记录号WOS:000268489400026
出版者SPIE-SOC PHOTOPTICAL INSTRUMENTATION ENGINEERS
源URL[http://ir.iccas.ac.cn/handle/121111/67231]  
专题中国科学院化学研究所
通讯作者Yuan, Jinghe
作者单位1.Chinese Acad Sci, Inst Chem, Key Lab Mol Nanostruct & Nanotechnol, Beijing 100190, Peoples R China
2.Yantai Univ, Inst Sci & Technol Optoelect Informat, Yantai 264005, Peoples R China
推荐引用方式
GB/T 7714
Yuan, Jinghe. Blind deconvolution of x-ray diffraction profiles by using high-order statistics[J]. OPTICAL ENGINEERING,2009,48(7).
APA Yuan, Jinghe.(2009).Blind deconvolution of x-ray diffraction profiles by using high-order statistics.OPTICAL ENGINEERING,48(7).
MLA Yuan, Jinghe."Blind deconvolution of x-ray diffraction profiles by using high-order statistics".OPTICAL ENGINEERING 48.7(2009).

入库方式: OAI收割

来源:化学研究所

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