中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface

文献类型:期刊论文

作者Chen, Peipei1,3; Chen, Long1; Han, Dong1; Zhai, Jin2; Zheng, Yongmei1; Jiang, Lei2
刊名SMALL
出版日期2009-04-20
卷号5期号:8页码:908-912
关键词Afm Force Curves Imaging Lotus Leaves Wettability
ISSN号1613-6810
DOI10.1002/smll.200801152
语种英语
WOS记录号WOS:000265868200002
出版者WILEY-V C H VERLAG GMBH
源URL[http://ir.iccas.ac.cn/handle/121111/68145]  
专题中国科学院化学研究所
通讯作者Han, Dong
作者单位1.Natl Ctr Nanosci & Technol, Beijing 100190, Peoples R China
2.Chinese Acad Sci, Ctr Mol Sci, Inst Chem, Beijing 100190, Peoples R China
3.Chinese Acad Sci, Grad Sch, Beijing 100864, Peoples R China
推荐引用方式
GB/T 7714
Chen, Peipei,Chen, Long,Han, Dong,et al. Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface[J]. SMALL,2009,5(8):908-912.
APA Chen, Peipei,Chen, Long,Han, Dong,Zhai, Jin,Zheng, Yongmei,&Jiang, Lei.(2009).Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface.SMALL,5(8),908-912.
MLA Chen, Peipei,et al."Wetting Behavior at Micro-/Nanoscales: Direct Imaging of a Microscopic Water/Air/Solid Three-Phase Interface".SMALL 5.8(2009):908-912.

入库方式: OAI收割

来源:化学研究所

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