Principle and Applications of Scanning Ion Conductance Microscopy
文献类型：期刊论文
| 作者 | Ji Tian-Rong; Liang Zhong-Wei; Zhu Xin-Yu; Shao Yuan-Hua |
| 刊名 | CHINESE JOURNAL OF ANALYTICAL CHEMISTRY
 |
| 出版日期 | 2010-12-01 |
| 卷号 | 38期号:12页码:1821-1827 |
| 关键词 | Scanning Ion Conductance Microscopy Principle Applications Review |
| ISSN号 | 0253-3820 |
| DOI | 10.3724/SP.J.1096.2010.01821 |
| 英文摘要 | Scanning ion conductance microscopy (SICM) is one type of scanning probe microscopy (SPM) techniques. By measuring the ionic current of an ultra-micropipette, it can be used to map the surface topography of a sample at high resolution without any contact. SICM has many remarkable advantages, such as high spatial resolution, simple preparation of the probe and no damage to the sample surface, particularly suitable for imaging living cells under physiological condition. Therefore, SICM is an important scanning probe microscopy technique complementary to scanning electrochemical microscopy and atomic force microscopy. SICM has been employed to image soft interfaces and surfaces, such as cell surface and its microstructure. In addition, SICM can be used in conjunction with other techniques to study the relationship between cell topography and function; it can also control the deposition of specific molecules to achieve nanometer-scale microscopic operation and fabrication. Herein, the history, principle, instrumentation, applications and prospects of SICM have been reviewed. |
| 语种 | 英语 |
| WOS记录号 | WOS:000287782500028 |
| 出版者 | ELSEVIER SCIENCE INC |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/70767]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Ji Tian-Rong |
| 作者单位 | Peking Univ, Coll Chem & Mol Engn, Inst Analyt Chem, Beijing Natl Lab Mol Sci, Beijing 100871, Peoples R China |
| 推荐引用方式 GB/T 7714 | Ji Tian-Rong,Liang Zhong-Wei,Zhu Xin-Yu,et al. Principle and Applications of Scanning Ion Conductance Microscopy[J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,2010,38(12):1821-1827. |
| APA | Ji Tian-Rong,Liang Zhong-Wei,Zhu Xin-Yu,&Shao Yuan-Hua.(2010).Principle and Applications of Scanning Ion Conductance Microscopy.CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,38(12),1821-1827. |
| MLA | Ji Tian-Rong,et al."Principle and Applications of Scanning Ion Conductance Microscopy".CHINESE JOURNAL OF ANALYTICAL CHEMISTRY 38.12(2010):1821-1827. |
入库方式： OAI收割
来源：化学研究所
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