中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of Relative Humidity on the Nanoscopic Topography and Dielectric Constant of Thin Films of PPy:PSS

文献类型:期刊论文

作者Sun, Ling1; Wang, Jianjun1,2; Butt, Hans-Juergen1; Bonaccurso, Elmar1,3
刊名SMALL
出版日期2011-04-04
卷号7期号:7页码:950-956
ISSN号1613-6810
DOI10.1002/smll.201100204
英文摘要The morphological, electric, and dielectric properties of water-based conjugated polymer blends, such as polypyrrole:polystyrene sulfonate (PPy:PSS) or poly(3,4-ethylenedioxythiophene):polystyrene sulfonate (PEDOT:PSS), are known to be influenced by the water content. These properties also influence the macroscopic performance when the conjugated polymer blends are employed in a device. An in situ humidity-dependence study on thin films of PPy:PSS by Kelvin probe force microscopy (KPFM) is presented. A particular KPFM mode, dielectric imaging, is used, which detects the second harmonic electrostatic force. Thin PPy:PSS films are drop-coated on hydrophobic graphite substrates. Upon increasing the relative humidity, the hydrophilic PSS is swelled and dewetted on the substrate, while the hydrophobic PPy remains almost unchanged. The swelling and dewetting of PSS results in irreversible morphological changes in the thin films, as well as nanoscopic rearrangement on the surface of the PPy:PSS films. The nanoscopic rearrangement can only be detected by dielectric imaging. It is also observed that relative humidity affects unannealed and thermally annealed PPy:PSS thin films differently.
语种英语
WOS记录号WOS:000289378000013
出版者WILEY-V C H VERLAG GMBH
源URL[http://ir.iccas.ac.cn/handle/121111/71441]  
专题中国科学院化学研究所
通讯作者Bonaccurso, Elmar
作者单位1.Max Planck Inst Polymer Res, D-55118 Mainz, Germany
2.Chinese Acad Sci, Inst Chem, Beijing 100190, Peoples R China
3.Tech Univ Darmstadt, Ctr Smart Interfaces, D-64287 Darmstadt, Germany
推荐引用方式
GB/T 7714
Sun, Ling,Wang, Jianjun,Butt, Hans-Juergen,et al. Influence of Relative Humidity on the Nanoscopic Topography and Dielectric Constant of Thin Films of PPy:PSS[J]. SMALL,2011,7(7):950-956.
APA Sun, Ling,Wang, Jianjun,Butt, Hans-Juergen,&Bonaccurso, Elmar.(2011).Influence of Relative Humidity on the Nanoscopic Topography and Dielectric Constant of Thin Films of PPy:PSS.SMALL,7(7),950-956.
MLA Sun, Ling,et al."Influence of Relative Humidity on the Nanoscopic Topography and Dielectric Constant of Thin Films of PPy:PSS".SMALL 7.7(2011):950-956.

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来源:化学研究所

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