Investigation of atomic structure ahead of crack tip by STM and AFM
文献类型:期刊论文
作者 | Li, XD; Wang, YB; Chu, WY; Wang, C; Bai, CL |
刊名 | SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES
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出版日期 | 1998-08-01 |
卷号 | 41期号:4页码:411-417 |
关键词 | Stm Afm Crack Tip Atomic Image Abnormal Elastic Region |
ISSN号 | 1006-9321 |
英文摘要 | The nanostructure and atomic structure ahead of the crack tip of highly oriented pyrolytic graphite has been studied by using scanning tunneling microscopy (STM) and that of mica by using atomic force microscopy (AFM). There are many small voids or vacancy clusters ahead of the crack rip, which can migrate with lime and result in the crack rip propagating because of the interaction force between the STM pinpoint and the sample. The nanostructure and atomic structure of loaded crack tip on (001) surface of mica has been observed by AFM. The results show that there exists a severely distorted region about 10 nm in width ahead of the loaded crack tip, and in this region there are many vacancies and vacancy clusters. Around this region there is an abnormal elastic region about 110 nm in width. |
语种 | 英语 |
WOS记录号 | WOS:000075346600009 |
出版者 | SCIENCE PRESS |
源URL | [http://ir.iccas.ac.cn/handle/121111/74397] ![]() |
专题 | 中国科学院化学研究所 |
通讯作者 | Wang, YB |
作者单位 | 1.Univ Sci & Technol Beijing, Dept Mat Phys, Beijing 100083, Peoples R China 2.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China |
推荐引用方式 GB/T 7714 | Li, XD,Wang, YB,Chu, WY,et al. Investigation of atomic structure ahead of crack tip by STM and AFM[J]. SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES,1998,41(4):411-417. |
APA | Li, XD,Wang, YB,Chu, WY,Wang, C,&Bai, CL.(1998).Investigation of atomic structure ahead of crack tip by STM and AFM.SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES,41(4),411-417. |
MLA | Li, XD,et al."Investigation of atomic structure ahead of crack tip by STM and AFM".SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES 41.4(1998):411-417. |
入库方式: OAI收割
来源:化学研究所
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