Surface imaging of fragile materials with hydrophobic atomic force microscope tips
文献类型：期刊论文
| 作者 | Wei, ZQ; Wang, C; Bai, CL |
| 刊名 | SURFACE SCIENCE
 |
| 出版日期 | 2000-11-10 |
| 卷号 | 467期号:1-3页码:185-190 |
| 关键词 | Atomic Force Microscopy Chemisorption Friction Interface States Self-assembly Silane Silicon Nitride Surface Structure Morphology Roughness And Topography |
| ISSN号 | 0039-6028 |
| 英文摘要 | In ambient air, the quality of atomic force microscope (AFM) images can be strongly affected by the capillary effect due to the formation of water meniscus between the AFM Si3N4 tips and the substrates. In view of this, we performed a direct surface modification of the bare tips using a self-assembled monolayer (SAM) of octadecyltrichlorosilane (OTS) to make the tips hydrophobic and eliminate this effect. The images, when collected with the thus obtained modified tips, showed improved performance of tips not only for hard samples but also for fragile systems. This investigation implies a chemical tip modification method to image samples with high resolution in air, by means of making the bare tips hydrophobic. (C) 2000 Elsevier Science B.V. NI rights reserved. |
| 语种 | 英语 |
| WOS记录号 | WOS:000165521000020 |
| 出版者 | ELSEVIER SCIENCE BV |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/75999]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Bai, CL |
| 作者单位 | 1.Chinese Acad Sci, Ctr Mol Sci, Beijing 100080, Peoples R China 2.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wei, ZQ,Wang, C,Bai, CL. Surface imaging of fragile materials with hydrophobic atomic force microscope tips[J]. SURFACE SCIENCE,2000,467(1-3):185-190. |
| APA | Wei, ZQ,Wang, C,&Bai, CL.(2000).Surface imaging of fragile materials with hydrophobic atomic force microscope tips.SURFACE SCIENCE,467(1-3),185-190. |
| MLA | Wei, ZQ,et al."Surface imaging of fragile materials with hydrophobic atomic force microscope tips".SURFACE SCIENCE 467.1-3(2000):185-190. |
入库方式： OAI收割
来源：化学研究所
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