Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy
文献类型：期刊论文
| 作者 | Du, BY; Tsui, OKC; Zhang, QL; He, TB |
| 刊名 | LANGMUIR
 |
| 出版日期 | 2001-05-29 |
| 卷号 | 17期号:11页码:3286-3291 |
| ISSN号 | 0743-7463 |
| DOI | 10.1021/la001434a |
| 英文摘要 | Nanometer-scale elastic moduli and yield strengths of polycarbonate (PC) and polystyrene (PS) thin films were measured with atomic force microscopy (AFM) indentation measurements. By analysis of the AFM indentation force curves with the method by Oliver and Pharr, Young's moduli of PC and PS thin films could be obtained as 2.2 +/- 0.1 and 2.6 +/- 0.1 GPa, respectively, which agree well with the literature values. By fitting Johnson's conical spherical cavity model to the measured plastic zone sizes, we obtained yield strengths of 141.2 MPa for PC thin films and 178.7 MPa for PS thin films, which are similar to2 times the values expected from the literature. We propose that it is due to the AFM indentation being asymmetric, which was not accounted for in Johnson's model. A correction factor, epsilon, of similar to0.72 was introduced to rescale the plastic zone size, whereupon good agreement between theory and experiment was achieved. |
| 语种 | 英语 |
| WOS记录号 | WOS:000168955300024 |
| 出版者 | AMER CHEMICAL SOC |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/77117]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Tsui, OKC |
| 作者单位 | 1.Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China 2.Chinese Acad Sci, Changchun Inst Appl Chem, State Key Lab Polymer Phys & Chem, Changchun 130022, Jilin, Peoples R China |
| 推荐引用方式 GB/T 7714 | Du, BY,Tsui, OKC,Zhang, QL,et al. Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy[J]. LANGMUIR,2001,17(11):3286-3291. |
| APA | Du, BY,Tsui, OKC,Zhang, QL,&He, TB.(2001).Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy.LANGMUIR,17(11),3286-3291. |
| MLA | Du, BY,et al."Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy".LANGMUIR 17.11(2001):3286-3291. |
入库方式： OAI收割
来源：化学研究所
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