Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopy
文献类型：期刊论文
| 作者 | Shang, GY; Wang, C; Lei, HN; Bai, CL |
| 刊名 | SURFACE AND INTERFACE ANALYSIS
 |
| 出版日期 | 2001-08-01 |
| 卷号 | 32期号:1页码:289-292 |
| 关键词 | Shear Force Probe-sample Distance Control Bimorph Scanning Near-field Optical Microscopy |
| ISSN号 | 0142-2421 |
| 英文摘要 | We present a non-optical shear force method to control the probe-sample distance for scanning near-field optical microscopy (SNOM). In this system, the detection of shear force is accomplished by attaching a tapered fibre-optic probe to a piezoelectric bimorph cantilever, which realizes the excitation and the detection simultaneously. The decrease in amplitude of the cantilever is observed when the probe approaches the sample and the shifts in resonance frequency are measured as a function of set-point. The shear force images can be obtained reliably because the set-point is >0.8. These results suggest that the system is reasonably sensitive to shear force and can be used easily for SNOM. Copyright (C) 2001 John Wiley & Sons, Ltd. |
| 语种 | 英语 |
| WOS记录号 | WOS:000170551800064 |
| 出版者 | WILEY-BLACKWELL |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/77657]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Bai, CL |
| 作者单位 | 1.Chinese Acad Sci, Inst Chem, Ctr Mol Sci, Beijing 100080, Peoples R China 2.Univ Reims, Lab Microscopies Elect & Tunnel, F-51685 Reims 2, France |
| 推荐引用方式 GB/T 7714 | Shang, GY,Wang, C,Lei, HN,et al. Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopy[J]. SURFACE AND INTERFACE ANALYSIS,2001,32(1):289-292. |
| APA | Shang, GY,Wang, C,Lei, HN,&Bai, CL.(2001).Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopy.SURFACE AND INTERFACE ANALYSIS,32(1),289-292. |
| MLA | Shang, GY,et al."Detection of shear force with a piezoelectric bimorph cantilever for scanning near-field optical microscopy".SURFACE AND INTERFACE ANALYSIS 32.1(2001):289-292. |
入库方式： OAI收割
来源：化学研究所
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