Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films
文献类型：期刊论文
| 作者 | Lin, Y; Jiang, FZ; Zhang, JB; Song, YL; Jiang, L; Xiao, XR |
| 刊名 | CHINESE CHEMICAL LETTERS
 |
| 出版日期 | 2002-05-01 |
| 卷号 | 13期号:5页码:484-486 |
| 关键词 | Nanocrystalline Tio2 Films Chemical Treatments Afm Topography Local Conductivity |
| ISSN号 | 1001-8417 |
| 英文摘要 | AFM has been utilized to study the surface topography and the local conductivity of nanocrystalline TiO2 films. Improving the local conductivity by Ti(iso-C3H7O)(4) treatment is characterized by quantitative analysis of the simultaneous current image. The mechanism of Ti(iso C3H7O)(4) treatment is discussed. |
| 语种 | 英语 |
| WOS记录号 | WOS:000175548400030 |
| 出版者 | CHINESE CHEMICAL SOCIETY |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/79025]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Lin, Y |
| 作者单位 | Chinese Acad Sci, Inst Chem, Ctr Mol Sci, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Lin, Y,Jiang, FZ,Zhang, JB,et al. Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films[J]. CHINESE CHEMICAL LETTERS,2002,13(5):484-486. |
| APA | Lin, Y,Jiang, FZ,Zhang, JB,Song, YL,Jiang, L,&Xiao, XR.(2002).Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films.CHINESE CHEMICAL LETTERS,13(5),484-486. |
| MLA | Lin, Y,et al."Atomic force microscopy studies on the chemical treatment of nanocrystalline porous TiO2 films".CHINESE CHEMICAL LETTERS 13.5(2002):484-486. |
入库方式： OAI收割
来源：化学研究所
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