中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Research for quantitative imaging X-ray photoelectron spectrometric analysis

文献类型:期刊论文

作者Liu, F; Qiu, LM; Zhao, LZ
刊名CHINESE JOURNAL OF ANALYTICAL CHEMISTRY
出版日期2003-09-01
卷号31期号:9页码:1082-1084
关键词Imaging X-ray Photoelectron Spectrometry Quantitative Analysis
ISSN号0253-3820
英文摘要We have explored the possibility of quantitative analysis based on the measurement of pixel intensity from the X-ray photoelectron spectrometric (XPS) image. The results for samples of AgCl and Na2S2O3 have shown, that there is a linear. relationship between pixel intensity and the acquisition time, and it is possible to do elemental or chemical state quantitative analysis by using the measured pixel intensities.
语种英语
WOS记录号WOS:000185756200015
出版者SCIENCE CHINA PRESS
源URL[http://ir.iccas.ac.cn/handle/121111/80383]  
专题中国科学院化学研究所
通讯作者Zhao, LZ
作者单位Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
推荐引用方式
GB/T 7714
Liu, F,Qiu, LM,Zhao, LZ. Research for quantitative imaging X-ray photoelectron spectrometric analysis[J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,2003,31(9):1082-1084.
APA Liu, F,Qiu, LM,&Zhao, LZ.(2003).Research for quantitative imaging X-ray photoelectron spectrometric analysis.CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,31(9),1082-1084.
MLA Liu, F,et al."Research for quantitative imaging X-ray photoelectron spectrometric analysis".CHINESE JOURNAL OF ANALYTICAL CHEMISTRY 31.9(2003):1082-1084.

入库方式: OAI收割

来源:化学研究所

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