Research for quantitative imaging X-ray photoelectron spectrometric analysis
文献类型:期刊论文
作者 | Liu, F; Qiu, LM; Zhao, LZ |
刊名 | CHINESE JOURNAL OF ANALYTICAL CHEMISTRY
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出版日期 | 2003-09-01 |
卷号 | 31期号:9页码:1082-1084 |
关键词 | Imaging X-ray Photoelectron Spectrometry Quantitative Analysis |
ISSN号 | 0253-3820 |
英文摘要 | We have explored the possibility of quantitative analysis based on the measurement of pixel intensity from the X-ray photoelectron spectrometric (XPS) image. The results for samples of AgCl and Na2S2O3 have shown, that there is a linear. relationship between pixel intensity and the acquisition time, and it is possible to do elemental or chemical state quantitative analysis by using the measured pixel intensities. |
语种 | 英语 |
WOS记录号 | WOS:000185756200015 |
出版者 | SCIENCE CHINA PRESS |
源URL | [http://ir.iccas.ac.cn/handle/121111/80383] ![]() |
专题 | 中国科学院化学研究所 |
通讯作者 | Zhao, LZ |
作者单位 | Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China |
推荐引用方式 GB/T 7714 | Liu, F,Qiu, LM,Zhao, LZ. Research for quantitative imaging X-ray photoelectron spectrometric analysis[J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,2003,31(9):1082-1084. |
APA | Liu, F,Qiu, LM,&Zhao, LZ.(2003).Research for quantitative imaging X-ray photoelectron spectrometric analysis.CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,31(9),1082-1084. |
MLA | Liu, F,et al."Research for quantitative imaging X-ray photoelectron spectrometric analysis".CHINESE JOURNAL OF ANALYTICAL CHEMISTRY 31.9(2003):1082-1084. |
入库方式: OAI收割
来源:化学研究所
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