Effect of low energy electron exposure on ion scattering spectroscopy
文献类型：期刊论文
| 作者 | Qiu, LM; Liu, F; Zhao, LZ |
| 刊名 | CHINESE CHEMICAL LETTERS
 |
| 出版日期 | 2003-10-01 |
| 卷号 | 14期号:10页码:1058-1061 |
| 关键词 | Ion Scattering Spectroscopy (Iss) Charge Neutralization Ion neutralizatIon |
| ISSN号 | 1001-8417 |
| 英文摘要 | The effect of low energy electron (LEE) exposure on ISS, including on the sputter peak and scatter peak as well as on ion neutralization, has been investigated for different samples. Some new results are discussed. |
| 语种 | 英语 |
| WOS记录号 | WOS:000185983600022 |
| 出版者 | CHINESE CHEMICAL SOCIETY |
| 源URL | [http://ir.iccas.ac.cn/handle/121111/81045]  |
| 专题 | 中国科学院化学研究所 |
| 通讯作者 | Qiu, LM |
| 作者单位 | Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Qiu, LM,Liu, F,Zhao, LZ. Effect of low energy electron exposure on ion scattering spectroscopy[J]. CHINESE CHEMICAL LETTERS,2003,14(10):1058-1061. |
| APA | Qiu, LM,Liu, F,&Zhao, LZ.(2003).Effect of low energy electron exposure on ion scattering spectroscopy.CHINESE CHEMICAL LETTERS,14(10),1058-1061. |
| MLA | Qiu, LM,et al."Effect of low energy electron exposure on ion scattering spectroscopy".CHINESE CHEMICAL LETTERS 14.10(2003):1058-1061. |
入库方式： OAI收割
来源：化学研究所
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