中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry

文献类型:期刊论文

作者Yao, Benxi1,2,3; Gu, Naiting1,2; Rao, Changhui1,2
刊名OPTIK
出版日期2018
卷号170页码:95-100
关键词Intensity scintillation Polarimetry error Polarizing beam splitter
ISSN号0030-4026
DOI10.1016/j.ijleo.2018.05.060
文献子类J
英文摘要The imaging polarimeter is an important tool to measure polarization properties to reconstruct solar magnetic field in solar observation, to discriminate between benign and malignant moles in the living human eye, and so on. In single-pass imaging polarimetry, the intensity scintillation induced by the source's instability or the seeing during the signals obtaining period will induce severe measurement error. Double-pass imaging polarimetry can significantly decrease this influence. In this paper, we have analyzed the measurement error induced by the intensity scintillation for single-pass and double-pass imaging polarimetries. And the simulation and experiment are presented. Their results are coincident with each other.
WOS关键词SOLAR TELESCOPE
语种英语
WOS记录号WOS:000440882500013
源URL[http://ir.ioe.ac.cn/handle/181551/9354]  
专题光电技术研究所_自适应光学技术研究室(八室)
作者单位1.The Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu; 610209, China;
2.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China;
3.University of Chinese Academy of Sciences, No.19A Yuquan Road, Beijing; 100049, China
推荐引用方式
GB/T 7714
Yao, Benxi,Gu, Naiting,Rao, Changhui. The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry[J]. OPTIK,2018,170:95-100.
APA Yao, Benxi,Gu, Naiting,&Rao, Changhui.(2018).The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry.OPTIK,170,95-100.
MLA Yao, Benxi,et al."The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry".OPTIK 170(2018):95-100.

入库方式: OAI收割

来源:光电技术研究所

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