Enhancing primary processing for small-angle X-ray scattering
文献类型：期刊论文
| 作者 | Wei, YR; Li ZH(李志宏) ; Wei YR(魏彦茹); Li, ZH
|
| 刊名 | INSTRUMENTATION SCIENCE & TECHNOLOGY
 |
| 出版日期 | 2017 |
| 卷号 | 45期号:1页码:22-34 |
| 关键词 | Detector tilt primary data processing program small-angle X-ray scattering |
| ISSN号 | 1073-9149 |
| DOI | 10.1080/10739149.2016.1205084 |
| 文献子类 | Article |
| 英文摘要 | A program is reported for primary processing of small-angle X-ray scattering from various cameras. The software integrates basic functions necessary for primary processing that include instrument parameter calibration, scattering angle calibration, the conversion of a two-dimensional image to a one-dimensional curve, background and absorption subtraction, and correction for collimation effects. All instrument parameters for primary processing needs were derived with high precision by fitting a diffraction ring of a standard without the measurement of other parameters. The program is applicable whether the detector photosensitive plane is vertical or tilted with respect to the direct beam and operates easily, automatically, and rapidly on Windows computers. This article describes the structure, function, and features of the software. |
| 电子版国际标准刊号 | 1525-6030 |
| WOS研究方向 | Chemistry ; Instruments & Instrumentation |
| 语种 | 英语 |
| WOS记录号 | WOS:000384404800003 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/284784]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Wei, YR,Li ZH,Wei YR,et al. Enhancing primary processing for small-angle X-ray scattering[J]. INSTRUMENTATION SCIENCE & TECHNOLOGY,2017,45(1):22-34. |
| APA | Wei, YR,李志宏,魏彦茹,&Li, ZH.(2017).Enhancing primary processing for small-angle X-ray scattering.INSTRUMENTATION SCIENCE & TECHNOLOGY,45(1),22-34. |
| MLA | Wei, YR,et al."Enhancing primary processing for small-angle X-ray scattering".INSTRUMENTATION SCIENCE & TECHNOLOGY 45.1(2017):22-34. |
入库方式： OAI收割
来源：高能物理研究所
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