中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy

文献类型:期刊论文

作者Bai, Chen; Liu, Chao; Jia, Hao; Peng, Tong; Min, Junwei; Lei, Ming; Yu, Xianghua; Yao, Baoli
刊名IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING
出版日期2019-10
卷号66期号:10页码:2979-2989
ISSN号0018-9294;1558-2531
关键词Light-sheet fluorescence microscopy blind image deconvolution denoising compressed sensing
DOI10.1109/TBME.2019.2899583
产权排序1
英文摘要

Objective: The side-lobes of a Bessel beam (BB) create a severe out-of-focus background in scanning light-sheet fluorescence microscopy, thereby extremely limiting the axial resolution. The complementary beam subtraction (CBS) method can significantly reduce the out-of-focus background by double scanning a BB and its complementary beam. However, the blurring and noise caused by the system instability during the double scanning and subtraction operations degrade the image quality significantly. Therefore, we propose a compressed blind deconvolution and denoising (CBDD) method that solves this problem. Methods: We use a unified formulation that comprehensively takes advantage of multiple compressed sensing reconstructions and blind sparse representation. Results: The simulations and experiments were performed using the microbeads and model organisms to verify the effectiveness of the proposed method. Compared with the CBS light-sheet method, the proposed CBDD algorithm achieved the gain improvement in the axial and lateral resolution of about 1.81 and 2.22 times, respectively, while the average signal-to-noise ratio (SNR) was increased by about 3 dB. Conclusion: Accordingly, the proposed method can suppress the noise level, enhance the SNR, and recover the degraded resolution simultaneously. Significance: The obtained results demonstrate the proposed CBDD algorithm is well suited to improve the imaging performance of the CBS light-sheet fluorescence microscopy.

语种英语
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS记录号WOS:000487192000030
源URL[http://ir.opt.ac.cn/handle/181661/31879]  
专题西安光学精密机械研究所_瞬态光学技术国家重点实验室
作者单位Chinese Acad Sci, State Key Lab Transient Opt & Photon, Xian Inst Opt & Precis Mech, Xian 710119, Shaanxi, Peoples R China
推荐引用方式
GB/T 7714
Bai, Chen,Liu, Chao,Jia, Hao,et al. Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy[J]. IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING,2019,66(10):2979-2989.
APA Bai, Chen.,Liu, Chao.,Jia, Hao.,Peng, Tong.,Min, Junwei.,...&Yao, Baoli.(2019).Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy.IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING,66(10),2979-2989.
MLA Bai, Chen,et al."Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy".IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING 66.10(2019):2979-2989.

入库方式: OAI收割

来源:西安光学精密机械研究所

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