中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A method to fabricate high-aspect-ratio microstructures using PMMA photoresist

文献类型:期刊论文

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作者Zhang TC(张天冲); Yi FT(伊福廷); Wang B(王波); Liu J(刘静); Wang YT(王雨婷); Zhou Y(周悦); Zhang, TC; Yi, FT; Wang, B; Liu, J
刊名MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS ; MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS
出版日期2018 ; 2018
卷号24期号:2页码:1223-1226
ISSN号0946-7076 ; 0946-7076
DOI10.1007/s00542-017-3490-x ; 10.1007/s00542-017-3490-x
文献子类Article ; Article
英文摘要Fabrications of high-aspect-ratio microstructures (HARMS) using negative photoresist have been studied a lot by researchers recently, but the removal of the resist is still a problem. We report a method to fabricate HARMS using PMMA, a positive photoresist. A classical microstructure, densely packed micro square columns, was tried in our study. A top grid made of negative photoresists was employed to join all the separate parts together to prevent them from tilting or clumping. The development and electroplating processes were not influenced by the top grid. Excellent nickel micro-pores-structures were obtained finally, demonstrating that the method is a promising way to fabricate HARMS especially when the resist needs to be removed.; Fabrications of high-aspect-ratio microstructures (HARMS) using negative photoresist have been studied a lot by researchers recently, but the removal of the resist is still a problem. We report a method to fabricate HARMS using PMMA, a positive photoresist. A classical microstructure, densely packed micro square columns, was tried in our study. A top grid made of negative photoresists was employed to join all the separate parts together to prevent them from tilting or clumping. The development and electroplating processes were not influenced by the top grid. Excellent nickel micro-pores-structures were obtained finally, demonstrating that the method is a promising way to fabricate HARMS especially when the resist needs to be removed.
电子版国际标准刊号1432-1858 ; 1432-1858
WOS关键词X-RAY-LITHOGRAPHY ; X-RAY-LITHOGRAPHY ; SU-8 PHOTORESIST ; REMOVAL ; RESIST ; SU-8 PHOTORESIST ; REMOVAL ; RESIST
WOS研究方向Engineering ; Engineering ; Science & Technology - Other Topics ; Materials Science ; Physics ; Science & Technology - Other Topics ; Materials Science ; Physics
语种英语 ; 英语
WOS记录号WOS:000423697800041 ; WOS:000423697800041
源URL[http://ir.ihep.ac.cn/handle/311005/285582]  
专题高能物理研究所_多学科研究中心
通讯作者Zhang TC(张天冲)
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Zhang TC,Yi FT,Wang B,et al. A method to fabricate high-aspect-ratio microstructures using PMMA photoresist, A method to fabricate high-aspect-ratio microstructures using PMMA photoresist[J]. MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS,2018, 2018,24, 24(2):1223-1226, 1223-1226.
APA 张天冲.,伊福廷.,王波.,刘静.,王雨婷.,...&Zhou, Y.(2018).A method to fabricate high-aspect-ratio microstructures using PMMA photoresist.MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS,24(2),1223-1226.
MLA 张天冲,et al."A method to fabricate high-aspect-ratio microstructures using PMMA photoresist".MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS 24.2(2018):1223-1226.

入库方式: OAI收割

来源:高能物理研究所

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