Characterization and on-line adjustment of the sagittal-bent Laue crystal profile
文献类型：期刊论文
| 作者 | Liu, X; Yang, JW ; Diao, QS; Liu, P; Zhang, XW; Hu, LF; Yang JW(杨佼汪); Liu X(刘旭); Dong WW(董伟伟); Cai Q(蔡泉)
|
| 刊名 | JOURNAL OF SYNCHROTRON RADIATION
 |
| 出版日期 | 2018 |
| 卷号 | 25页码:1346-1353 |
| ISSN号 | 1600-5775 |
| 关键词 | sagittal-bent Laue crystal optical metrology double-crystal topography anticlastic curvature ray-tracing measurement |
| DOI | 10.1107/S1600577518008056 |
| 文献子类 | Article |
| 英文摘要 | The sagittal-bent Laue monochromator can provide an ideal way to focus high-energy X-ray beams. However, the anticlastic curvature induced by sagittal bending has a great influence on the crystal performance. Thus, characterizing the bent-crystal shape is very important for predicting the performance of the bent-crystal monochromator. In this paper the crystal profile is measured by off-line optical metrology and on-line X-ray experiments. The off-line results showed that the bent-crystal surface could be well fitted to a saddle surface apart from a redundant cubic term which was related to the different couples applied on the crystal. On-line characterization of the meridional and the sagittal radius of the bent crystal includes double-crystal topography and ray-tracing measurement. In addition, the double-crystal topography experiment could be used as a quick diagnostic method for the bending condition adjustment. The sagittal radius of the bent crystal was characterized through a ray-tracing experiment by using a particularly designed tungsten mask. Moreover, rocking curves under different bending conditions were measured as well. The results were highly consistent with analytical results derived from the elastic theory. Furthermore, radii along different vertical positions under various bending conditions were measured and showed a quadratic relationship between the vertical positions and the meridional radii. |
| WOS关键词 | SYNCHROTRON X-RAYS ; MONOCHROMATOR ; OPTICS ; DIFFRACTION ; RADIATION ; BEAMLINE |
| WOS研究方向 | Instruments & Instrumentation ; Optics ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000443810500006 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/286307]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 通讯作者 | Hu LF(胡凌飞) |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Liu, X,Yang, JW,Diao, QS,et al. Characterization and on-line adjustment of the sagittal-bent Laue crystal profile[J]. JOURNAL OF SYNCHROTRON RADIATION,2018,25:1346-1353. |
| APA | Liu, X.,Yang, JW.,Diao, QS.,Liu, P.,Zhang, XW.,...&Yang, FG.(2018).Characterization and on-line adjustment of the sagittal-bent Laue crystal profile.JOURNAL OF SYNCHROTRON RADIATION,25,1346-1353. |
| MLA | Liu, X,et al."Characterization and on-line adjustment of the sagittal-bent Laue crystal profile".JOURNAL OF SYNCHROTRON RADIATION 25(2018):1346-1353. |
入库方式： OAI收割
来源：高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。