Characterization of Kinoform X-ray lens using image stitching method based on marked structures
文献类型：期刊论文
| 作者 | Hua, Wenqiang; He, Qili ; Sheng, Weifan; Zhu, Peiping; Yuan, Qingxi; Wang, Jie; Zhu, Zhongzhu; Liao, Keliang; Yuan QX(袁清习); Zhu PP(朱佩平)
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| 刊名 | COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE
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| 出版日期 | 2018 |
| 卷号 | 875页码:88-97 |
| ISSN号 | 1865-0929 |
| DOI | 10.1007/978-981-13-1702-6_9 |
| 文献子类 | Proceedings Paper |
| 英文摘要 | The unique structure of the kinoform x-ray lens render most image stitching methods difficult to realize the image registration of sub-images acquired by commercial optical microscope with the high power objective, yet it is important to evaluate the fabrication defects using image processing methods in the foundation of the stitched image. In this work we demonstrate the quantitative characterization of the kinoform x-ray lens by using image stitching method based on extracting the geometric features of dedicated marked structures, which could not only avoid the problem of lacking effective features in the lens structure but also provide a reference for the scaling and rotation operations during the image alignment. The proposed stitching method provides us a convenient way to analyze the shape error and various fabrication imperfections for the kinoform x-ray lens. © Springer Nature Singapore Pte Ltd., 2018. |
| 会议地点 | Beijing, China |
| 语种 | 英语 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/286602]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 通讯作者 | Liao KL(廖可梁) |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Hua, Wenqiang,He, Qili,Sheng, Weifan,et al. Characterization of Kinoform X-ray lens using image stitching method based on marked structures[J]. COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE,2018,875:88-97. |
| APA | Hua, Wenqiang.,He, Qili.,Sheng, Weifan.,Zhu, Peiping.,Yuan, Qingxi.,...&廖可梁.(2018).Characterization of Kinoform X-ray lens using image stitching method based on marked structures.COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE,875,88-97. |
| MLA | Hua, Wenqiang,et al."Characterization of Kinoform X-ray lens using image stitching method based on marked structures".COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE 875(2018):88-97. |
入库方式： OAI收割
来源：高能物理研究所
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