Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor
文献类型：期刊论文
| 作者 | Hou, J. P.; Chen, Q. Y.; Wang, Q.; Yu, H. Y.; Zhang, Z. J.; Li, R.; Li, X. W.; Zhang, Z. F.; Wang, Q; Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China. |
| 刊名 | ELSEVIER SCIENCE SA
 |
| 出版日期 | 2017-11-07 |
| 卷号 | 707页码:511-517 |
| ISSN号 | 0921-5093 |
| 关键词 | CommerciAlly Pure Al Conductor Strength Annealing Treatment Texture Evolution |
| 英文摘要 | Strength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the < 111 > texture was changed into the < 001 > one in the CPACs annealed at a temperature of 90 degrees C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 degrees C to 300 degrees C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis.; Strength degradation during the electron transmission process is always a hidden danger to the overhead transmission lines. In this study, the microstructure evolutions and the strength degradation behaviors of a cold drawn commercially pure Al conductor (CPAC) were investigated systematically by a series of annealing experiments. The results show that the texture evolution, dislocation recovery and subgrain growth during the recrystallization should be responsible for the strength degradation of CPAC. Besides, the microstructure evolution depends on the annealing temperature. For instance, some of the < 111 > texture was changed into the < 001 > one in the CPACs annealed at a temperature of 90 degrees C; while, there is an obvious increase in the subgrain width when the CPACs were annealed in the high temperature range from 150 degrees C to 300 degrees C. Finally, the strength degradation due to the texture evolution and the subgrain coarsening was quantitatively calculated based on the crystallographic analysis. |
| 学科主题 | Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering |
| 语种 | 英语 |
| 资助机构 | State Grid Corporation of China [52110416001z]; National Natural Science Foundation of China (NSFC) [51331007] |
| 公开日期 | 2018-01-10 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/78985]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Wang, Q; Zhang, ZF (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, 72 Wenhua Rd, Shenyang 110016, Liaoning, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Hou, J. P.,Chen, Q. Y.,Wang, Q.,et al. Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor[J]. ELSEVIER SCIENCE SA,2017,707:511-517. |
| APA | Hou, J. P..,Chen, Q. Y..,Wang, Q..,Yu, H. Y..,Zhang, Z. J..,...&Zhang, ZF .(2017).Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor.ELSEVIER SCIENCE SA,707,511-517. |
| MLA | Hou, J. P.,et al."Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor".ELSEVIER SCIENCE SA 707(2017):511-517. |
入库方式： OAI收割
来源：金属研究所
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