中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Nanoindentation of thin-film-substrate system: Determination of film hardness and Young's modulus

文献类型:期刊论文

作者Chen SH(陈少华); Liu L(刘磊); Wang ZQ(王自强)
刊名Acta Mechanica Sinica
出版日期2004
卷号20期号:4页码:383-392
通讯作者邮箱chenshaohua72@hotmail.com
关键词Nanoindentation Hardness Young'S Modulus Film-Substrate System Wear-Resistant Coatings Mechanical-Properties Indentation Experiments
ISSN号0567-7718
通讯作者Chen, SH (reprint author), Chinese Acad Sci, Inst Mech, LNM, Beijing 100080, Peoples R China.
中文摘要In the present paper, the hardness and Young's modulus of film-substrate systems are determined by means of nanoindentation experiments and modified models. Aluminum film and two kinds of substrates; i.e. glass and silicon, are studied. Nanoindentation XP II and continuous stiffness mode are used during the experiments. In order to avoid the influence of the Oliver and Pharr method used in the experiments, the experiment data are analyzed with the constant Young's modulus assumption and the equal hardness assumption. The volume fraction model (CZ model) proposed by Fabes et al. (1992) is used and modified to analyze the measured hardness. The method proposed by Doerner and Nix (DN formula) (1986) is modified to analyze the measured Young's modulus. Two kinds of modified empirical formula are used to predict the present experiment results and those in the literature, which include the results of two kinds of systems, i.e., a soft film on a hard substrate and a hard film on a soft substrate. In the modified CZ model, the indentation influence angle, phi, is considered as a relevant physical parameter, which embodies the effects of the indenter tip radius, pile-up or sink-in phenomena and deformation of film and substrate.
类目[WOS]Engineering, Mechanical ; Mechanics
研究领域[WOS]Engineering ; Mechanics
关键词[WOS]WEAR-RESISTANT COATINGS ; MECHANICAL-PROPERTIES ; INDENTATION EXPERIMENTS
收录类别SCI ; EI ; CSCD
语种英语
WOS记录号WOS:000223688000008
公开日期2009-08-03 ; 2010-06-13
源URL[http://dspace.imech.ac.cn/handle/311007/33775]  
专题力学研究所_力学所知识产出(1956-2008)
推荐引用方式
GB/T 7714
Chen SH,Liu L,Wang ZQ. Nanoindentation of thin-film-substrate system: Determination of film hardness and Young's modulus[J]. Acta Mechanica Sinica,2004,20(4):383-392.
APA 陈少华,刘磊,&王自强.(2004).Nanoindentation of thin-film-substrate system: Determination of film hardness and Young's modulus.Acta Mechanica Sinica,20(4),383-392.
MLA 陈少华,et al."Nanoindentation of thin-film-substrate system: Determination of film hardness and Young's modulus".Acta Mechanica Sinica 20.4(2004):383-392.

入库方式: OAI收割

来源:力学研究所

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