中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A moving-coil designed micro-mechanics tester with application on MEMS

文献类型:期刊论文

作者Huan Y(郇勇); Zhang TH(张泰华); Yang YM(杨业敏)
刊名Measurement Science & Technology
出版日期2007
卷号18期号:11页码:3612-3616
通讯作者邮箱zhangth@lnm.imech.ac.cn
关键词Micro-Mechanics Tester Design Mems Thin-Films Mechanical-Properties Nanoindentation Technique
ISSN号0957-0233
通讯作者Zhang, TH (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100080, Peoples R China.
中文摘要A moving-coil designed micro-mechanics tester, named as MicroUTM (universal testing machine), is in-house developed in this paper for micro-mechanics tests. The main component is a moving coil suspended in a uniform magnetic field through a set of springs. When a current passes through the coil, the electromagnetic force is proportional to the magnitude of the current, so the load can easily be measured by the current. The displacement is measured using a capacitive sensor. The load is calibrated using a Sartorius BP211D analytical balance, with a resolution/range of 0.01 mg/80 g or 0.1 mg/210 g. The displacement is calibrated using a HEIDENHAIN CT-6002 length gauge with an accuracy of +/- 0.1 mu m. The calibration results show that the load range is +/- 1 N and the displacement range is +/- 300 mu m. The noise levels of the load and displacement are 50 mu N and 150 nm, respectively. The nonlinearity of the load is only 0.2%. Several in-plane load tests of the MEMS micro-cantilever are performed using this tester. Experimental results, with excellent repeatability, demonstrate the reliability of the load measurement as well as the flexible function of this tester.
类目[WOS]Engineering, Multidisciplinary ; Instruments & Instrumentation
研究领域[WOS]Engineering ; Instruments & Instrumentation
关键词[WOS]THIN-FILMS ; MECHANICAL-PROPERTIES ; NANOINDENTATION TECHNIQUE
收录类别SCI
语种英语
WOS记录号WOS:000250199500047
公开日期2009-08-03 ; 2010-06-13
源URL[http://dspace.imech.ac.cn/handle/311007/33895]  
专题力学研究所_力学所知识产出(1956-2008)
推荐引用方式
GB/T 7714
Huan Y,Zhang TH,Yang YM. A moving-coil designed micro-mechanics tester with application on MEMS[J]. Measurement Science & Technology,2007,18(11):3612-3616.
APA Huan Y,Zhang TH,&Yang YM.(2007).A moving-coil designed micro-mechanics tester with application on MEMS.Measurement Science & Technology,18(11),3612-3616.
MLA Huan Y,et al."A moving-coil designed micro-mechanics tester with application on MEMS".Measurement Science & Technology 18.11(2007):3612-3616.

入库方式: OAI收割

来源:力学研究所

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