中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing

文献类型:期刊论文

作者Xiaochen Liu;  Lihao Wang;  Yinfang Zhu;  Junyuan Zhao;  Jinying Zhang;  Jinling Yang;  Fuhua Yang
刊名Journal of Micromechanics & Microengineering
出版日期2018
卷号28期号:11页码:115003
源URL[http://ir.semi.ac.cn/handle/172111/29018]  
专题半导体研究所_半导体集成技术工程研究中心
推荐引用方式
GB/T 7714
Xiaochen Liu;Lihao Wang;Yinfang Zhu;Junyuan Zhao;Jinying Zhang;Jinling Yang;Fuhua Yang. A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing[J]. Journal of Micromechanics & Microengineering,2018,28(11):115003.
APA Xiaochen Liu;Lihao Wang;Yinfang Zhu;Junyuan Zhao;Jinying Zhang;Jinling Yang;Fuhua Yang.(2018).A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing.Journal of Micromechanics & Microengineering,28(11),115003.
MLA Xiaochen Liu;Lihao Wang;Yinfang Zhu;Junyuan Zhao;Jinying Zhang;Jinling Yang;Fuhua Yang."A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing".Journal of Micromechanics & Microengineering 28.11(2018):115003.

入库方式: OAI收割

来源:半导体研究所

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