中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A low-rank estimation method for CTIS image reconstruction

文献类型:期刊论文

作者Li, Qifeng1; Wang, Yang1; Ma, Xiangyun1; Du, Wenfang1; Wang, Huijie1; Zheng, Xinwei2; Chen, Da3
刊名MEASUREMENT SCIENCE AND TECHNOLOGY
出版日期2018-09-01
卷号29期号:9页码:6
关键词hyperspectral image computed tomography image spectrometers image reconstruction low-rank estimation
ISSN号0957-0233
DOI10.1088/1361-6501/aad1e6
通讯作者Li, Qifeng(qfli@tju.edu.cn) ; Chen, Da(dachen@tju.edu.cn)
英文摘要The computed tomography image spectrometer (CTIS) is a snapshot hyperspectral imaging technique, which enables hyperspectral image acquisition in a dynamic scene. However, traditional image reconstruction methods with no explicit constraints will introduce high-frequency noise. The low-rank property has been used in hyperspectral image denoising and achieved great effects. We develop an effective method of low-rank estimation (LRE) for CTIS image reconstruction, which shows significant improvements in both the image quality and the spectral quality of the reconstructed image. Compared with the traditional methods, the peak signal-to-noise ratio of the LRE hyperspectral image can be increased by 8 dB, and the spectral-angular mapping can be decreased by 4 times.
WOS关键词SPECTROMETER ; MICROSCOPY
资助项目National Key Research and Development Program of China[2014YQ060773] ; National Key Research and Development Program of China[2017YFC0803603] ; State Key Laboratory of Precision Measuring Technology and Instruments[PIL1605]
WOS研究方向Engineering ; Instruments & Instrumentation
语种英语
WOS记录号WOS:000440631400001
出版者IOP PUBLISHING LTD
资助机构National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; 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National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; State Key Laboratory of Precision Measuring Technology and Instruments ; 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源URL[http://ir.hfcas.ac.cn:8080/handle/334002/37739]  
专题合肥物质科学研究院_中科院强磁场科学中心
通讯作者Li, Qifeng; Chen, Da
作者单位1.Tianjin Univ, Sch Precis Instrument & Optoelect Engn, Tianjin 300072, Peoples R China
2.Chinese Acad Sci, High Magnet Field Lab, Hefei 230031, Anhui, Peoples R China
3.Tianjin Univ, State Key Lab Precis Measurement Technol & Instru, Tianjin 300072, Peoples R China
推荐引用方式
GB/T 7714
Li, Qifeng,Wang, Yang,Ma, Xiangyun,et al. A low-rank estimation method for CTIS image reconstruction[J]. MEASUREMENT SCIENCE AND TECHNOLOGY,2018,29(9):6.
APA Li, Qifeng.,Wang, Yang.,Ma, Xiangyun.,Du, Wenfang.,Wang, Huijie.,...&Chen, Da.(2018).A low-rank estimation method for CTIS image reconstruction.MEASUREMENT SCIENCE AND TECHNOLOGY,29(9),6.
MLA Li, Qifeng,et al."A low-rank estimation method for CTIS image reconstruction".MEASUREMENT SCIENCE AND TECHNOLOGY 29.9(2018):6.

入库方式: OAI收割

来源:合肥物质科学研究院

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