Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)
文献类型：期刊论文
| 作者 | Congxin Xia; Wenqi Xiong; Juan Du; Tianxing Wang; Zhongming Wei; Jingbo Li |
| 刊名 | JOURNAL OF PHYSICS D-APPLIED PHYSICS
 |
| 出版日期 | 2018 |
| 卷号 | 51期号:1页码:015107 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/29253]  |
| 专题 | 半导体研究所_半导体超晶格国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li. Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2018,51(1):015107. |
| APA | Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li.(2018).Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca).JOURNAL OF PHYSICS D-APPLIED PHYSICS,51(1),015107. |
| MLA | Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li."Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)".JOURNAL OF PHYSICS D-APPLIED PHYSICS 51.1(2018):015107. |
入库方式： OAI收割
来源：半导体研究所
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