中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Incident angle dependence of secondary electron emission from carbon induced by swift H-2(+)

文献类型:期刊论文

作者Lu, QL; Zhou, ZY; Shi, LQ; Zhao, GQ
刊名CHINESE PHYSICS
出版日期2005-07-01
卷号14页码:1465-1470
关键词secondary electron emission incidence angle Monte-Carlo simulation valence electron statistical distribution
ISSN号1009-1963
英文摘要The incident angle dependence of secondary electron emission induced by a swift H-2(+) ion impinging on carbon is studied using the Monte Carlo method combined with the semiempirical theory. The relationships both between the electron emission yield and the project angle and between the statistics and the projectile angle are investigated. The results show that the backward electron emission yield deviates from the inverse cosine law, due to the effect of the valence electrons of H-2(+). The ratio of the forward electron emission yield to the backward electron emission yield at the inclining incidence is different from that at the normal incidence. The statistical distribution of electron emission is independent of the incident angle. The value of b, the deviation parameter from the Poisson distribution, increases with projectile energy.
WOS关键词MONTE-CARLO-SIMULATION ; MULTIPLE ELASTIC-SCATTERING ; MOLECULAR-IONS ; MEV H+ ; STATISTICS ; SOLIDS ; ALUMINUM ; SURFACES ; TARGETS ; METALS
WOS研究方向Physics
语种英语
WOS记录号WOS:000230329300035
出版者CHINESE PHYSICAL SOC
源URL[http://119.78.100.186/handle/113462/25865]  
专题中国科学院近代物理研究所
通讯作者Lu, QL
作者单位1.Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
2.Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
3.Fudan Univ, Inst Modern Phys, Appl Ion Beam Phys Lab, Shanghai 200433, Peoples R China
推荐引用方式
GB/T 7714
Lu, QL,Zhou, ZY,Shi, LQ,et al. Incident angle dependence of secondary electron emission from carbon induced by swift H-2(+)[J]. CHINESE PHYSICS,2005,14:1465-1470.
APA Lu, QL,Zhou, ZY,Shi, LQ,&Zhao, GQ.(2005).Incident angle dependence of secondary electron emission from carbon induced by swift H-2(+).CHINESE PHYSICS,14,1465-1470.
MLA Lu, QL,et al."Incident angle dependence of secondary electron emission from carbon induced by swift H-2(+)".CHINESE PHYSICS 14(2005):1465-1470.

入库方式: OAI收割

来源:近代物理研究所

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