Incident angle dependence of secondary electron emission from carbon induced by swift H-2(+)
文献类型：期刊论文
| 作者 | Lu, QL; Zhou, ZY; Shi, LQ; Zhao, GQ |
| 刊名 | CHINESE PHYSICS
 |
| 出版日期 | 2005-07-01 |
| 卷号 | 14页码:1465-1470 |
| 关键词 | secondary electron emission incidence angle Monte-Carlo simulation valence electron statistical distribution |
| ISSN号 | 1009-1963 |
| 英文摘要 | The incident angle dependence of secondary electron emission induced by a swift H-2(+) ion impinging on carbon is studied using the Monte Carlo method combined with the semiempirical theory. The relationships both between the electron emission yield and the project angle and between the statistics and the projectile angle are investigated. The results show that the backward electron emission yield deviates from the inverse cosine law, due to the effect of the valence electrons of H-2(+). The ratio of the forward electron emission yield to the backward electron emission yield at the inclining incidence is different from that at the normal incidence. The statistical distribution of electron emission is independent of the incident angle. The value of b, the deviation parameter from the Poisson distribution, increases with projectile energy. |
| WOS关键词 | MONTE-CARLO-SIMULATION ; MULTIPLE ELASTIC-SCATTERING ; MOLECULAR-IONS ; MEV H+ ; STATISTICS ; SOLIDS ; ALUMINUM ; SURFACES ; TARGETS ; METALS |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000230329300035 |
| 出版者 | CHINESE PHYSICAL SOC |
| 源URL | [http://119.78.100.186/handle/113462/25865]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Lu, QL |
| 作者单位 | 1.Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China 2.Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China 3.Fudan Univ, Inst Modern Phys, Appl Ion Beam Phys Lab, Shanghai 200433, Peoples R China |
| 推荐引用方式 GB/T 7714 | Lu, QL,Zhou, ZY,Shi, LQ,et al. Incident angle dependence of secondary electron emission from carbon induced by swift H-2(+)[J]. CHINESE PHYSICS,2005,14:1465-1470. |
| APA | Lu, QL,Zhou, ZY,Shi, LQ,&Zhao, GQ.(2005).Incident angle dependence of secondary electron emission from carbon induced by swift H-2(+).CHINESE PHYSICS,14,1465-1470. |
| MLA | Lu, QL,et al."Incident angle dependence of secondary electron emission from carbon induced by swift H-2(+)".CHINESE PHYSICS 14(2005):1465-1470. |
入库方式： OAI收割
来源：近代物理研究所
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