Burnout current density of bismuth nanowires
文献类型:期刊论文
作者 | Cornelius, T. W.1; Picht, O.1; Mueller, S.1; Neumann, R.1; Voelklein, F.2; Karim, S.3; Duan, J. L.4 |
刊名 | JOURNAL OF APPLIED PHYSICS
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出版日期 | 2008-05-15 |
卷号 | 103页码:5 |
ISSN号 | 0021-8979 |
DOI | 10.1063/1.2927443 |
英文摘要 | Single bismuth nanowires with diameters ranging from 100 nm to 1 mu m were electrochemically deposited in ion track-etched single-pore polycarbonate membranes. The maximum current density the wires are able to carry was investigated by ramping up the current until failure occurred. It increases by three to four orders of magnitude for nanowires embedded in the template compared to bulk bismuth and rises with diminishing diameter. Simulations show that the wires are heated up electrically to the melting temperature. Since the surface-to-volume ratio rises with diminishing diameter, thinner wires dissipate the heat more efficiently to the surrounding polymer matrix and, thus, can tolerate larger current densities. (C) 2008 American Institute of Physics. |
WOS关键词 | BI NANOWIRES ; FILMS ; ELECTROMIGRATION ; CONDUCTIVITY ; RESISTIVITY ; FABRICATION ; TRANSPORT |
WOS研究方向 | Physics |
语种 | 英语 |
WOS记录号 | WOS:000256303800073 |
出版者 | AMER INST PHYSICS |
源URL | [http://119.78.100.186/handle/113462/29872] ![]() |
专题 | 中国科学院近代物理研究所 |
通讯作者 | Cornelius, T. W. |
作者单位 | 1.Gesellschaft Schwerionenforsch GSI, D-64291 Darmstadt, Germany 2.Univ Appl Sci Wiesbaden, Inst Microtechnol, D-65428 Russelsheim, Germany 3.Univ Marburg, Dept Chem, D-35032 Marburg, Germany 4.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China |
推荐引用方式 GB/T 7714 | Cornelius, T. W.,Picht, O.,Mueller, S.,et al. Burnout current density of bismuth nanowires[J]. JOURNAL OF APPLIED PHYSICS,2008,103:5. |
APA | Cornelius, T. W..,Picht, O..,Mueller, S..,Neumann, R..,Voelklein, F..,...&Duan, J. L..(2008).Burnout current density of bismuth nanowires.JOURNAL OF APPLIED PHYSICS,103,5. |
MLA | Cornelius, T. W.,et al."Burnout current density of bismuth nanowires".JOURNAL OF APPLIED PHYSICS 103(2008):5. |
入库方式: OAI收割
来源:近代物理研究所
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