Overview of the Shanghai EBIT
文献类型：期刊论文
| 作者 | Fu, Y.; Yao, K.; Wei, B.; Lu, D.; Hutton, R.; Zou, Y.1 |
| 刊名 | JOURNAL OF INSTRUMENTATION
 |
| 出版日期 | 2010-08-01 |
| 卷号 | 5页码:10 |
| 关键词 | Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS)) Plasma diagnostics - charged-particle spectroscopy Ionization and excitation processes |
| ISSN号 | 1748-0221 |
| DOI | 10.1088/1748-0221/5/08/C08011 |
| 英文摘要 | EBIT (Electron Beam Ion Trap) is an excellent instrument both as light source and ion source, and is widely used in atomic physics research. In principle EBITs can produce ions of any charge state and of any element. In this report, a general introduction to the Shangai EBIT and short discussions of the spectroscopy platform are presented. Due to the repetitious running of the Shanghai EBIT over the past 5 years, it became necessary for the Shanghai EBIT to be disassembled for some maintenances and further modifications/improvements. The new design contains two major improvements. Furthermore, some experimental results on studies of dielectronic recombination processes for highly charged Xe ions will be discussed. |
| WOS关键词 | BEAM ION-TRAP ; HIGHLY-CHARGED IONS ; SPECTROSCOPY ; TRANSITIONS |
| WOS研究方向 | Instruments & Instrumentation |
| 语种 | 英语 |
| WOS记录号 | WOS:000283795200009 |
| 出版者 | IOP PUBLISHING LTD |
| 源URL | [http://119.78.100.186/handle/113462/33212]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Zou, Y. |
| 作者单位 | 1.Fudan Univ, Key Lab, Minist Educ, Appl Ion Beam Phys Lab, Shanghai 200433, Peoples R China 2.Fudan Univ, Dept Nucl Sci & Technol, Inst Modern Phys, Shanghai EBIT Lab, Shanghai 200433, Peoples R China |
| 推荐引用方式 GB/T 7714 | Fu, Y.,Yao, K.,Wei, B.,et al. Overview of the Shanghai EBIT[J]. JOURNAL OF INSTRUMENTATION,2010,5:10. |
| APA | Fu, Y.,Yao, K.,Wei, B.,Lu, D.,Hutton, R.,&Zou, Y..(2010).Overview of the Shanghai EBIT.JOURNAL OF INSTRUMENTATION,5,10. |
| MLA | Fu, Y.,et al."Overview of the Shanghai EBIT".JOURNAL OF INSTRUMENTATION 5(2010):10. |
入库方式： OAI收割
来源：近代物理研究所
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