Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device
文献类型：期刊论文
| 作者 | Sakaue, H. A.1; Yamamoto, N.2; Morita, S.1; Nakamura, N.3; Chen, C.4; Kato, D.1; Kikuchi, H.3; Murakami, I.1; Ohtani, S.3; Tanuma, H.5 |
| 刊名 | JOURNAL OF APPLIED PHYSICS
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| 出版日期 | 2011-04-01 |
| 卷号 | 109页码:9 |
| ISSN号 | 0021-8979 |
| DOI | 10.1063/1.3549707 |
| 英文摘要 | Extreme ultraviolet (EUV) spectra of highly charged iron ions in a wavelength range of 100-300 angstrom have been observed from two different plasma sources of the Tokyo Electron Beam Ion Trap (Tokyo-EBIT) with a monoenergetic electron beam and a Large Helical Device (LHD) with Maxwellian electron energy. The excitation process of the spectral lines is compared between the two plasmas, and it is found that the excitation process for Fe XIX - Fe XXII ions is clearly different. Namely, the EUV emission lines from the EBIT plasma are only dominated by electron impact excitation connected to the ground state, but the excitation mechanism is not so simple in the LHD plasma. The difference in the excitation process is studied by measuring the intensity ratio of EUV emission lines (114.412 angstrom [1s(2)2s2p(2) (2)P(3/2) -> 1s(2)2s(2)2p (2)P(3/2)]/117.144 angstrom [1s(2)2s2p(2) (2)P(1/2) -> 1s(2)2s(2)2p (2)P(1/2)]) arising from different ground levels in the Fe XXII ions. The line intensity ratio has an extremely small value of 0.2 in the EBIT plasma with a low beam current of 30 mA and a beam energy of 2 keV, while the ratio varies with the electron density ne in the LHD plasmas, i.e.,0.35 for n(e) - 1 x 10(13) cm(-3) and 0.65 for n(e) - 4 x 10(13) cm(-3). Here, the electron density of the EBIT plasma is estimated to be smaller than 10(12) cm(-3) and the electron temperature of the LHD plasmas is 2 keV. The dependence of the line intensity ratio on the observed electron density is analyzed for both the EBIT and the LHD plasmas using several collisional-radiative (CR) models. The present experimental data can easily be reproduced by the analysis when the thermal proton impact excitation is taken into account. The importance of the proton impact excitation is also experimentally verified by injecting an iron pellet into the LHD plasmas and changing the ratio of the proton density to the electron density. (C) 2011 American Institute of Physics. [doi:10.1063/1.3549707] |
| WOS关键词 | RATE COEFFICIENTS ; FE-XXII ; EXCITATION ; PLASMA ; ACCELERATION ; WAVELENGTHS ; PROJECT ; PELLETS ; IMPACT ; XIII |
| 资助项目 | JSPS-CAS |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000289949000019 |
| 出版者 | AMER INST PHYSICS |
| 资助机构 | JSPS-CAS |
| 源URL | [http://119.78.100.186/handle/113462/33531]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Sakaue, H. A. |
| 作者单位 | 1.Natl Inst Nat Sci, Natl Inst Fus Sci, Toki, Gifu 5095292, Japan 2.Osaka Univ, Inst Laser Engn, Suita, Osaka 5650871, Japan 3.Univ Electrocommun, Inst Laser Sci, Tokyo 1828585, Japan 4.Fudan Univ, Inst Modern Phys, Shanghai 200433, Peoples R China 5.Tokyo Metropolitan Univ, Tokyo 1920397, Japan 6.Natl Inst Nat Sci, Natl Astron Observ Japan, Mitaka, Tokyo 1818588, Japan 7.Max Planck Inst Nucl Phys, D-69117 Heidelberg, Germany |
| 推荐引用方式 GB/T 7714 | Sakaue, H. A.,Yamamoto, N.,Morita, S.,et al. Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device[J]. JOURNAL OF APPLIED PHYSICS,2011,109:9. |
| APA | Sakaue, H. A..,Yamamoto, N..,Morita, S..,Nakamura, N..,Chen, C..,...&Tawara, H..(2011).Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device.JOURNAL OF APPLIED PHYSICS,109,9. |
| MLA | Sakaue, H. A.,et al."Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device".JOURNAL OF APPLIED PHYSICS 109(2011):9. |
入库方式： OAI收割
来源：近代物理研究所
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