Electron beam density study using a portable slit imaging system at the Shanghai Electron Beam Ion Trap
文献类型：期刊论文
| 作者 | Yang Yang1,2; Lu Di1,2; Fu Yun-Qing1,2; Yao Ke1,2; Chen Wei-Dong1,2; Xiao Jun1,2; Geng Zhi-Xian1,2; Hutton, Roger1,2; Zou Ya-Ming1,2 |
| 刊名 | CHINESE PHYSICS B
 |
| 出版日期 | 2011-08-01 |
| 卷号 | 20页码:7 |
| 关键词 | electron beam density slit imaging de-convolution |
| ISSN号 | 1674-1056 |
| DOI | 10.1088/1674-1056/20/8/080701 |
| 英文摘要 | In this work, a portable slit imaging system is developed to study both the electron beam diameter and the profile of the newly developed Shanghai Electron Beam Ion Trap (Shanghai EBIT). Images are detected by a charge coupled device (CCD) sensitive to both X rays and longer wavelength photons (up to visible). Large scale ray tracings were conducted for correcting the image broadening effects caused by the finite slit width and the finite width of the CCD pixels. A numerical de-convolution method was developed to analyse and reconstruct the electron beam density distribution in the EBIT. As an example of the measured beam diameter and current density, the FWHM (full width at half maximum) diameter of the electron beam at 81 keV and 120 mA is found to be 76.2 mu m and the density 2.00 x 10(3) A.cm(-2), under a magnetic field of 3 T, including all corrections. |
| WOS关键词 | HIGHLY-CHARGED IONS ; TEMPERATURE |
| 资助项目 | National Natural Science Foundation of China[11074049] ; Chinese National Fusion Project for ITER[2009GB106001] ; Shanghai Leading Academic Discipline Project, China[B107] |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000294810700020 |
| 出版者 | IOP PUBLISHING LTD |
| 资助机构 | National Natural Science Foundation of China ; Chinese National Fusion Project for ITER ; Shanghai Leading Academic Discipline Project, China |
| 源URL | [http://119.78.100.186/handle/113462/33623]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Zou Ya-Ming |
| 作者单位 | 1.Minist Educ, Key Lab Appl Ion Beam Phys, Shanghai 200433, Peoples R China 2.Fudan Univ, Shanghai Electron Beam Ion Trap Lab, Inst Modern Phys, Shanghai 200433, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yang Yang,Lu Di,Fu Yun-Qing,et al. Electron beam density study using a portable slit imaging system at the Shanghai Electron Beam Ion Trap[J]. CHINESE PHYSICS B,2011,20:7. |
| APA | Yang Yang.,Lu Di.,Fu Yun-Qing.,Yao Ke.,Chen Wei-Dong.,...&Zou Ya-Ming.(2011).Electron beam density study using a portable slit imaging system at the Shanghai Electron Beam Ion Trap.CHINESE PHYSICS B,20,7. |
| MLA | Yang Yang,et al."Electron beam density study using a portable slit imaging system at the Shanghai Electron Beam Ion Trap".CHINESE PHYSICS B 20(2011):7. |
入库方式： OAI收割
来源：近代物理研究所
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